SARA-R42 - Application note
UBX-20050829 - R02 Testing Page 43 of 58
C1-Public
Table 15: List of pins available for +UTEST digital testing
Below is an example of configuring GPIO 1 as output and set to high.
Configure the formatting of the error result code by
means of the +CMEE AT command.
Deregister the module from the network.
The module enters the test mode.
(pin description returned)
OK
Gets the pin information.
AT+UTEST=10,2,"000000000000
000000008000"
Put the module in interface initialized state; the
command saves the pins status to restore it at the end
of the test. Pins enabled for testing: GPIO1 pin 16
Where hex: 0000 0000 0000 0000 0000 8000
AT+UTEST=10,3,"000000000000
000000000000"
GPIO1 is configured for output where the bits for pin 16
are set low
Where hex: 0000 0000 0000 0000 0000 0000
AT+UTEST=10,4,"000000000000
000000008000"
GPIO1 is set to high for pin 16
Where hex: 0000 0000 0000 0000 0000 8000
Configurations made by the AT+UTEST=10,2;
AT+UTEST=10,3 and AT+UTEST=10,4 commands are
executed.
000000000000000000008000
OK
Logic digital value measured at modules pins for
GPIO1, and "high" level detected.
Below is an example of configuring RTS and CTS as output and set to high. This example can only be
done through the USB interface.
Configure the formatting of the error result code.
Deregister the module from the network.
The module enters the test mode.