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Agilent Technologies 4395A - Page 39

Agilent Technologies 4395A
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Memory
Arrays .
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A
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F
ormat/Unit conversion
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A
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Data
Hold .
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A
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Data
Math .
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A
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Data
Trace Array
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A
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Memory
Trace Array
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A
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Scaling
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A
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Data
Processing
for
Impedance
Measurement
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. A
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Digital
Filter
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A
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V
oltage/Current
Ratio
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A
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I-V
to
Reection
Coecient
Conversion
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A
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Calibration
Coecient
Arrays/Calibration
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A
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A
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A
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Raw
Data
Arrays
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A
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Fixture
Compensation
Coecient
Arrays/Fixture
Compensation
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A
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Data
Arrays
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A
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Memory
Arrays
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A
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Conversion
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A
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F
ormat
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A
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Data
Hold
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A
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Data
Math
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A-12
Data
Trace
Array
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A
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Memory
Trace
Array
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A-12
Scaling
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A
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Network
Measurement
Basics
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A-13
S-parameters
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A
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Conversion
Function
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A-14
Smith
Chart
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A
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P
olar
Chart
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A
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Electrical
Delay
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A
veraging (Sweep
A
veraging)
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A
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IF
Band Reduction
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A
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Group
Delay .
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A
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Spectrum
Measurement
Basics
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A
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Detection
Modes
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A
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P
ositive
and
Negative
P
eak
Modes
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A
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Sample
Mode
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A
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Swept
Spectrum
Analyzers
versus
FFT
Analyzers
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A-19
Selectivity
of
the
RBW
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A-21
Noise
measurement
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A-22
Noise F
ormat and Marker Noise F
orm . .
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A-22
Sample Detection Mode for Noise Measurement
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A-22
VBW for Noise Measurement . . . . . . . .
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A-22
Impedance Measurement Basics . . . . . . . . . .
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A-23
I-V Measurement Method . . . . . . . . . . . . . . . . . . .
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A-23
Basic Concept of I-V Method
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A-23
How This Is Dierent From Impedance Conversion in the Network Analyzer
Mode ........................
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A-23
Impedance Measurement Scheme . . . . . . . . . . . . . . . . . . . . . . . A-25
Measurement Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . A-25
Test Signal Level at DUT . . . . . . . . . . . . . . . . . . . . . . . . . . A-25
Measurement Points and Display Points .... .. .. .. .. .. .... . . A-27
Channel Coupling .............................. A-28
Limit Line Concept .. .. .. .. .. .... .. .. .. .. .. ... .. A-29
How Limit Lines are Entered . . . . . . . . . . . . . . . . . . . . . . . . A-29
Contents-13

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