Why did the front panel EEPROM checksum test fail on my Agilent Technologies 6674A?
The front panel EEPROM checksum test might have failed on your Agilent Technologies Power Supply possibly due to power loss during a write operation. If power loss is not the problem, the EEPROM A1U6 could be defective.
What causes EEPROM write failure in Agilent Technologies 6674A?
EEPROM write failure in Agilent Technologies Power Supply may be caused by a defective EEPROM A1U6 or a calibration error.
What causes the front panel ROM test to fail on Agilent Technologies 6674A Power Supply?
The front panel ROM test failure on Agilent Technologies Power Supply may be caused by ROM AlU4 or address latches AlU8.
What causes CV or CC DAC tests to fail in Agilent Technologies 6674A Power Supply?
CV or CC DAC tests failure in Agilent Technologies Power Supply may be caused by CV DAC A5U507/U508 or CC DAC A5U509/U510.
What could be the reason for ambient temperature readback test failure in Agilent Technologies Power Supply?
The ambient temperature readback test failure in Agilent Technologies Power Supply may be caused by thermistor A5RT770 or comparator.
What could be the reason for secondary interface 5 volt readback test failure in Agilent Technologies Power Supply?
Secondary interface 5 volt readback test failure in Agilent Technologies Power Supply may be caused by comparators A5U513 or a failed readback DAC.
General| Output Voltage | 0 to 60 V |
|---|---|
| Number of Outputs | 1 |
| Line Regulation | 0.01% + 2 mV |
| Programming Accuracy Current | 0.1% + 5 mA |
| Input Frequency | 47 to 63 Hz |
| Operating Temperature Range | 0 to 50 °C |
| Storage Temperature Range | -40 to 70 °C |
| Cooling | Forced air |
| Current Ripple and Noise (20Hz to 20MHz) | 5 mArms |
| Relative Humidity | 0 to 95% non-condensing |
| Load Regulation | 0.01% + 2 mV |
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