Pub. Number
Basics of Measuring the Dielectric 5091-3300E
Properties of Materials,
Application note 1217-1
Understanding the Fundamental 5965-7707E
Principles of Vector Network Analysis,
Application note 1287-1
Exploring the Architectures of 5965-7708E
Network Analyzers
Application note 1287-2
Applying Error Correction to 5965-7709E
Network Analyzer Measurements,
Application note 1287-3
Network Analyzer Measurements: 5965-7710E
Filter and Amplifier Examples,
Application note 1287-4
Improving Throughput in Network 5966-3317E
Analyzer Applications,
Application note 1287-5
Using a Network Analyzer to 5966-3319E
Characterize High-Power Components,
Application note 1287-6
Improving Network Analyzer Measure- 5966-3318E
ments of Frequency-Translating
Devices, Application note 1287-7
Simplified Filter Tuning Using 5968-5328E
Time-Domain Analysis,
Application note 1287-8
In-Fixture Measurements Using 5968-5329E
Vector Network Analyzers,
Application note 1287-9
8 Hints for Making Better Network 5965-8166E
Analyzer Measurements,
Application note 1291-1
Specifying Calibration Standards 5956-4352
for the Agilent 8510 Network Analyzer,
Product note 8510-5A
Applying TRL Cal to Non-Coaxial 5091-3645E
Measurements, Product note 8510-8A
Testing Amplifiers and Active 5091-1942E
Devices with the Agilent 8720C,
Product note 8720-1
In-Fixture Measurements with the 5091-1943E
Agilent 8720C, Product note 8720-2
MS-DOS
®
is a U.S. registered trademark of Microsoft Corporation.
Windows
®
is a U.S. registered trademark of Microsoft Corporation.
Application and Product Notes
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Printed in USA, July 13, 2006
5968-5162E
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