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Emerson Copeland EV2 Series - Hi-Pot Testing

Emerson Copeland EV2 Series
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28
Board Temp High
Processor over-heating. Verify proper airflow over the
heat-sink of the drive. Remove any obstructions. If
the problem, still persists replace the drive.
79
81
10
MICRO TEMP
HIGH
7 HI-POT TESTING
There many different types of dielectric testers available. When selecting one to use ensure it
has the following features:
Can test to voltages up to 4000VDC or higher.
Can read leakage currents less than 10µA.
Has Arc Detection available.
Recommended test settings:
APPLIED VOLTAGE: 3650 VDC
MAXIMUM LEAKAGE CURRENT: Contact Applications Engineer
RAMP UP TIME: 8 Seconds
DWELL TIME: 5 Seconds
RAMP DOWN: 8 Seconds
Test Procedure:
Setup test on a clean and dry non-conductive surface.
Ensure samples are handled properly and using ESD precautions.
Verify the dielectric tester is configured per “Recommended test settings”.
Contact Application Engineer for more details on connections and wiring setup.
Execute Test.
Note and record the maximum leakage current during the dwell period.
Once test is complete, safely disconnect the component and store it properly.

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