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Hitachi RED670 - Final Adjustment of Compensation for VT Ratio Differences; Completing the Test; Loss of Voltage Check LOVPTUV; Measuring the Operate Limit of Set Values

Hitachi RED670
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11.6.5.5 Final adjustment of compensation for VT ratio differences
SEMOD175258-183 v2
Procedure
1. With the protection in test mode, view the differential voltage service values in each phase on
the local HMI under Main menu /Test /Function status /Voltage protection /
VoltageDiff(PTOV,60) /VDCPTOV:x .
The IED voltage inputs should be connected to the VTs according to valid
connection diagram.
2. Record the differential voltages.
3. Calculate the compensation factor RFLx for each phase.
For information about calculation of the compensation factor, see the application manual.
4. Set the compensation factors on the local HMI under Main menu /Settings /Settings group
N /Voltage protection /VoltageDiff(PTOV,60) /VDCPTOV:x
5. Check that the differential voltages are close to zero.
11.6.5.6 Completing the test
SEMOD175258-208 v2
Continue to test another function or end the test by changing the TESTMODE setting to Off. Restore
connections and settings to the original values, if changed for testing purposes.
11.6.6 Loss of voltage check LOVPTUV
SEMOD175023-3 v5
Prepare the IED for verification of settings as outlined in section
"Requirements" and
section "Preparing for test" in this chapter.
11.6.6.1 Measuring the operate limit of set values
SEMOD175023-7 v7
1. Check that the input logical signals BLOCK, CBOPEN and VTSU are logical zero.
2. Supply a three-phase rated voltage in all three phases and note on the local HMI that the TRIP
logical signal is equal to the logical 0.
3. Switch off the voltage in all three phases.
After set tTrip time a TRIP signal appears on the corresponding binary output or on the local
HMI.
Note that TRIP at this time is a pulse signal, duration should be according to set
tPulse.
4. Inject the measured voltages at rated values for at least set tRestore time.
5. Activate the CBOPEN binary input.
6. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
7. Inject the measured voltages at rated values for at least set tRestore time.
8. Activate the VTSU binary input.
9. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
10. Reset the VTSU binary input.
11. Inject the measured voltages at rated values for at least set tRestore time.
12. Activate the BLOCK binary input.
13. Simultaneously disconnect all the three-phase voltages from the IED.
No TRIP signal should appear.
14. Reset the BLOCK binary input.
Section 11 1MRK 505 378-UEN Rev. K
Testing functionality by secondary injection
190 Line differential protection RED670
Commissioning manual
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