Specifications A-9
System Speeds
Measurement
1
MAXIMUM RANGE CHANGE RATE: 65/second.
MAXIMUM MEASURE AUTORANGE TIME: 40ms (fixed source)
2
.
SWEEP OPERATION
3
READING RATES (rdg/second) FOR 60Hz (50Hz):
Source-Measure
NPLC/Trigger Measure Source-Measure Pass/Fail Tes t
4
Source-Memory
4
Speed Origin To Mem. To GPIB To Mem. To GPIB To Mem. To GPIB To Mem. To GPIB
Fast 0.01 / internal 2080 (2030) 1210 (1210) 1550(1515) 1010 (1010) 930 (900) 840 (840) 163 (162) 163 (162)
0.01 / external 1250 (1200) 1090 (1050) 1030 (990) 920 (920) 860 (830) 780 (780) 161 (160) 161 (160)
Medium 0.10 / internal 5 0 5 (433) 505 (433) 465 (405) 465 (405) 390 (343) 390 (343) 132 (126) 132 (126)
0.10 / external 43 5 (380) 435 (380) 405 (360) 405 (360) 375 (333) 375 (333) 130 (125) 130 (125)
Normal 1.00 / internal 59 (49) 59 (49) 58 (48) 58 (48) 57 (47) 57 (47) 4 4 (38) 44 (38)
1.00 / external 57 (48) 57 (48) 57 (48) 5 7 (48) 56 (47) 5 6 (47) 4 4 (38) 44 (38)
SINGLE READING OPERATION READING RATES (rdg/second) FOR 60Hz (50Hz):
Measure Source-Measure
5
Source-Measure Pass/Fail Test
4, 5
Speed NPLC/Trigger Origin To GPIB To GPIB To GPIB
Fast 0.01 / internal 2 5 6 (256) 83 (83) 83 (83)
Medium 0.10 / internal 1 8 1 (166) 73 (70) 73 (70)
Normal 1.00 / internal 49 (42) 35 (31) 34 (30)
COMPONENT HANDLER INTERFACE TIME:
4, 6
Speed NPLC/Trigger Origin Measure Pass/Fail Test Source Pass/Fail Test Source-Measure Pass/Fail Test
7
Fast 0.01 / external 1.01 ms (1.08 ms) 0.5 ms (0.5 ms) 5.3 ms (5.3 ms)
Medium 0.10 / external 2.5 ms (2.9 ms) 0.5 ms (0.5 ms) 6.7 ms (7.1 ms)
Normal 1.00 / external 17.5 ms (20.9 ms) 0.5 ms (0.5 ms) 21.7 ms (25.0 ms)
1
Reading rates applicable for volt age or current measurements. Auto zero of f, autorange of f, filter of f, display of f, trigger delay = 0, source auto clear of f, and
binary reading format.
2
Purely resistive load. 10 A range <65ms.
3
1000 point sweep was characterized with the source on a fixed range.
4
Pass/Fail test performed using one high limit and one low math limit.
5
Includes time to re-program source to a new level before making measurement.
6
T ime from falling edge of STA R T OF TEST signal to falling edge of end of test signal.
7
Command processing time of :SOURce:VOLTage|CURRent:TRIGgered <nrf> command not included.