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Mitsubishi A2CCPU - Page 57

Mitsubishi A2CCPU
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4.
AZCCPU
,/MELSEC-A
(1)
Application
By
using the sampling trace function,
it
is
possible to shorten
debugging time by confirming the data of the designated
devices in defined intervals during debugging.
(2)
Devices which can be sampled
Devices and the number of points which
can
be sampled are
indicated below.
(b) Word devices
(T/C present value, D,
W,
R,
A,
Z,
V)----=-.
Max.
3
points
(3)
Number of sampling times
The number of sampling times involves the following
two
cases: total number of sampling times and the number of
sampling times after
the
execution of the STRA instruction.
(a)
Total number of sampling times
This sets the area where the sampling data
is
stored.
Setting is possible in the range of
0
to
1024
times (in units
of
128
times).
(b) Number
of
sampling times after the execution of the STRA
instruction
This setting is used to end the sampling trace and latch the
sampling trace data after the execution of
the
STRA
instruction.
Setting is possible in the range of
0
to
1024
times (in units
of
128
times.)
The number of sam-
pling times after the Total number of
1024
times
execution of the
'
sampling times
STRA
instruction
STRA
instructian
executed
Number
of
sampling times
Device data
is
latched after
the
designated
number
of
sample times after the execution
oi
the
STRA
instruction
Fig.
4.19
Number
of
SampUng
Tim-
4-29
IB
INA)
Bg238A

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