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General| Microscope Type | Scanning Probe Microscope (SPM) |
|---|---|
| Operating System | Windows |
| Techniques | AFM, Raman Spectroscopy |
| AFM Modes | Contact, Force Modulation, Phase Imaging |
| Raman Spectral Range | 100 - 4000 cm⁻¹ |
| Scan Range | 100x100x10 µm |
| Laser Wavelengths | 532 nm, 633 nm, 785 nm |
| Detectors | CCD, PMT |
| Software | Nova |
| Spatial Resolution | AFM: 0.1 nm (lateral), 0.01 nm (vertical); Raman: ~ 500 nm (visible), ~ 250 nm (UV) |
| Resolution | AFM: 0.1 nm (lateral), 0.01 nm (vertical); Raman: ~ 500 nm (visible), ~ 250 nm (UV) |
General description of the SNOM measuring head and its application in near-field optical microscopy.
Explains the optical scheme and functionality of the SNOM measuring head in Transmission Illumination Mode.
Details the components, arrangement, and mounting of the optical cantilever deflection detection system.
Describes the optical tube's role in radiation redirection and its positioning device.
Details the Laser Beam Delivery System (LBDS) for secure and efficient transfer of laser radiation.
Explains the PMT module for converting optical signals to electrical signals and its operational considerations.
Procedure for removing and installing the base unit's replaceable panel, detailing screws and frames.
Instructions for mounting the optical tube onto the positioning device, including scanner preparation.
Guidance on connecting the LBDS to the optical tube and radiation feedthrough for detection channel adjustment.
Details on preparing samples, using metallic substrates, and mounting them onto the sample holder.
Instructions for preparing and installing the aperture probe, including glue application and careful handling.
Procedure for installing the probe holder onto the measuring head, including electrical connection.
Steps for mounting the measuring head onto the base unit, ensuring proper alignment and probe tip clearance.
Initial steps to approach the sample and select the desired scan area using the optical viewing system.
Procedure for aligning the sample surface with the lens focal plane for optimal radiation detection.
Steps to power on instrument components and start the Nova control program for system operation.
Detailed procedure for adjusting the optical cantilever deflection detection system using illuminator or laser.
Covers sample approach procedures and fine-tuning the detection channel after initial alignment.
Details on aligning the laser beam delivery channel for precise sample irradiation and radiation collection.
Explains the two main scanning stages: scanning-by-laser for alignment and scanning-by-sample for data acquisition.
Instructions on how to save acquired measurement data from RAM to the hard disk.
Steps for safely retracting the sample, powering down the instrument, and closing the control program.
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