Chapter 4. Performing Measurements
4.1. Approaching the Sample and Fine Adjusting the
Detection Channel
Approaching the sample to the probe
Perform approaching the sample to the probe according to the procedure of contact AFM.
For details, refer to manual NTEGRA Probe NanoLaboratory. Performing measurements,
Part 3. Here, only the procedural sequence is presented:
− Adjusting the Contact controller configuration;
− Adjusting the initial level of the DFL signal;
− Approaching the sample to the probe;
− Adjusting the working level of the feedback gain.
Fine adjusting the detection channel
After the sample approaches the probe, the sample surface appears shifted out of the focal
plane of the optical tube. So, the detection channel needs some further (fine)
readjustment.
To adjust the detection channel precisely, perform the following steps:
1. Open the feedback loop by releasing the
button in the Main Operations panel.
The probe-sample distance will be ∼10 µm.
2. With one of the movement screws (pos. 1 or pos. 2 in Fig. 4-1), carefully move the
probe away from the viewing field of the objective. Watch the probe image on the
monitor of the optical viewing system. Notice position of the probe to enable its easy
return to the initial position later.
Fig. 4-1. Adjusting elements of the detection system
1, 2 – screws for X and Y movements of the probe;
3 – screw for fine focusing of the objective; 4, 5 – screws for positioning the photodiode;
6 – screw for Z movement of the optical tube
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