Chapter 1. Basic Information
provides a wide spectral range (400 <λ < 800 nm for the laser with λ =830 nm) thus
allowing for observing the sample through the optical microscope and for optical exciting
the sample surface. High sensitivity of the detection system is due to a special design of
the laser formation system.
This measuring head is distinct in design from others in that its cantilever deflection
detection system operates with a nearly horizontal probe. For SNOM measurements, the
probe stays at low angle to horizontal (2÷3°).
Specification of the measuring head is presented in Table 1-1.
Table 1-1. Specification of the optical measuring head
Objective numerical aperture
550 nm)
Laser wavelength of the cantilever deflection
detection system
650 nm
Aperture probe
Structurally, the aperture probe is an elastic beam or cantilever (see pos. 2 in Fig. 1-6)
fixed on a silicon base (probe chip). The sensitive element of the probe is located in the
free end of the probe.
Mostly, probes of two following types are used:
− with a straight rectangular cantilever (Fig. 1-6 a);
− with a triangular cantilever formed by two beams (Fig. 1-6 b).
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