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A Variety of Observation Methods, Freely Usable
Quickly and Easily Acquire the Images Required for Observation
Ideal for any industrial microscopic observation method, the DSX510 offers a variety of observation modes that deliver the high-
resolution images users expect from high-end optics.
With virtually every industrial observation method just a click
away, the DSX510 makes it easy to choose the right one for the
task at hand. No complicated adjustments needed — simply
choose between modes (brightfi eld, darkfi eld, MIX [BF + DF],
Differential Interference Contrast, polarized light) and start
creating high-end images that meet precise demands.
Choose the Observation Method with One Easy Click
A click of a button delivers the required image on screen
DIC
Differential Interference
Contrast observation —
ideal for inspecting uneven
surfaces or nanometer-level
imperfections.
PO
Polarized light observation —
a valuable technique for
eliminating glare on substrates.
Allows surfaces characteristics
to be accurately displayed.
BF
Brightfield observation —
the most common microscopic
observation method.
DF
Darkfield observation —
the best way to identify
defects. Illuminate images
from the side to emphasize
imperfections.
MIX (BF + DF)
Use BF and DF at the same
time, combining the best of BF
ease of observation with the
specific emphasis of DF defect
observation.
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