PN 350-025004-09
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Specifications
ATR Crystal Choices Diamond/ZnSe, Ge, ZnSe, Si
Crystal Plate Mounting User changeable plates
Crystal Plate Mount Stainless steel
Angle of Incidence 45 degrees, nominal
Crystal Dimensions, Surface 1.8 mm (single reflection), 6.0 mm (multiple reflection)
Pressure Device Rotating, continuously variable pressure; click stop at maximum.
Digital Force Adapter (option)
Load cell sensor for precise and reproducible pressure control.
Attaches directly to MIRacle clamp. Digital readout.
Maximum Pressure 10,000 psi (single reflection)
Sample Access 55 mm, ATR crystal to pressure mount
Heating Options Ambient to 60 or 130 °C maximum
Accuracy +/- 0.5%
Sensor Type 3 wire Pt RTD (low drift, high stability)
Temperature Control
Digital or digital with PC control (up to 10 ramps, automated data
collection, USB interface)
Input Voltage 90-264 VAC, auto setting, external power supply
Operating Voltage 2.5 A/24 VDC/50 W
Specular Reflection Option Optional, 45 degree nominal angle of incidence
Accessory Dimensions (W x D x H) 104 x 103 x 210 mm (excludes FTIR baseplate and mount)
Effects of Temperature
The PIKE Technologies MIRacle utilizes a metallic gasket to seal the crystal to its mount. This sealing
mechanism allows some flexibility and hot samples may be placed on the crystal without damaging the
crystal or seal. However, it is recommended that the temperature difference between the sample and
the crystal be no more than 30 °C. So for a crystal at room temperature, the sample may be at a
temperature of up to 50 °C. Do not exceed sample temperature greater than 60 °C when using the
single reflection diamond MIRacle ATR crystal. Apply only room temperature samples to MIRacle
3- and 9-reflection ATR plates. Please contact PIKE Technologies if you wish to place samples of a higher
temperature on the crystal surface. Heated MIRacle plates are also available and can be heated up to
130 °C (60 °C for diamond).
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