Tektronix TDS 420A Reference

Automated Measurement Selections
Select
Measurement
Period
Frequency
Positive
Width
Negative
Width
—more—
1 of 7
Rise Time
Fall Time
Positive
Duty Cycle
Negative
Duty Cycle
—more—
2 of 7
Delay
Phase
Burst Width
—more—
3 of 7
High
Low
Max
Min
—more—
4 of 7
Pk–Pk
Amplitude
Positive
Overshoot
Negative
Overshoot
—more—
5 of 7
Mean
Cycle Mean
RMS
Cycle RMS
—more—
6 of 7
Area
Cycle Area
To Take Measurements Automatically:
Press Select Measrmnt or Snapshot
in main menu.
Press the MEASURE button.
Select up to four
measurements.
Press the CLEAR MENU button to move
measurement readouts away from graticule.
12
3
4
To
1 of 7
—more—
7 of 7
Incoming
Signal
Waveform
Drawn on CRT
Samples Acquired
for Each Waveform
Data Point Interval
Displayed
Data Point
Acquisition Mode
Processes
Samples
How the Acquisition Modes Work:
Use to reduce apparent noise
in a repetitive signal.
Use for fastest acquisition rate.
Sample is the default mode.
Use to reveal aliasing and for
glitch detection.
Peak Detect provides the
benefits of enveloping with
speed of single acquisition.
Use to reduce apparent noise.
Hi Res provides the benefits
of averaging with the speed of
single acquisition.
Use to reveal the noise band
around the signal.
Single
Waveform
Acquisition
Multiple
Waveform
Acquisitions
Sample
Peak Detect
Hi Res
Envelope
Average
Uses first sample in interval
Uses highest and lowest
samples in interval
Calculates average of
samples in interval
Uses highest and lowest
samples over many acquisitions
Calculates average value over
many acquisitions

Tektronix TDS 420A Specifications

General

Brand	Tektronix
Model	TDS 420A
Category	Test Equipment
Language	English