Tektronix TDS 520B - Figure 4-27: Jitter Test Displayed Waveform

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Performance Tests

TDS 500B, 600B and TDS 700A Service Manual

4–69

Figure 4–27: Jitter Test Displayed Waveform – TDS 684B Shown

c. Press SHIFT; then press ACQUIRE MENU.

d. Press the main-menu Mode.

e. Select the side-menu Average. It should be already set to 16.

f. Press the main-menu Create Limit Test Template.

g. Press the side-menu V Limit.

h. Use the keypad to set V Limit to 180 mdiv (press 180, SHIFT, m, then

ENTER)

i. Press the side-menu OK Store Template.

j. Press MORE.

k. Press the main-menu Ref1.

l. Press CH1.

m. Press SHIFT; then press ACQUIRE MENU.

n. Press the main-menu Limit Test Setup.

o. Toggle the side-menu Limit Test to ON.

p. Toggle the side-menu Ring Bell if Condition Met to ON.

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Table of Contents8
Table 1-1: Key Features of the TDS 500B, 600B and 700A29
Table 1-2: Record Length Vs. Divisions Per Record, Samples Per31
Table 1-3: Nominal Traits - Signal Acquisition System37
Table 1-4: Nominal Traits - Time Base System38
Table 1-5: Nominal Traits - Triggering System39
Table 1-6: Nominal Traits - Display System40
Table 1-7: Nominal Traits - GPIB Interface, Output Ports, and Power Fuse40
Table 1-8: Nominal Traits - Data Handling and Reliability40
Table 1-9: Nominal Traits - Mechanical41
Table 1-10: Warranted Characteristics - Signal Acquisition44
Table 1-11: Warranted Characteristics - Time Base System45
Table 1-12: Warranted Characteristics - Triggering System46
Table 1-13: Warranted Characteristics - Output Ports, Probe46
Table 1-14: Warranted Characteristics - Environmental47
Table 1-15: Typical Characteristics - Signal Acquisition System51
Table 1-16: Typical Characteristics - Triggering System55
Table 2-1: Power-Cord Conductor Identification61
Table 2-2: Power Cord Identification61
Table 2-3: Effects of Corrupted Data63
Figure 2-1: Map of Display Functions67
Figure 4-1: Map of Display Functions84
Figure 4-2: Verifying Adjustments and Signal-Path Compensation87
Figure 4-3: Universal Test Hookup for Functional Tests - TDS 600B Shown89
Table 4-1: Test Equipment97
Table 4-2: DC Offset Accuracy (Zero Setting)109
Figure 4-4: Measurement of DC Offset Accuracy at Zero Setting110
Figure 4-5: Initial Test Hookup111
Table 4-3: DC Voltage Measurement Accuracy112
Figure 4-6: Measurement of DC Accuracy at Maximum Offset and Position113
Figure 4-7: Initial Test Hookup115
Figure 4-8: Optional Initial Test Hookup115
Table 4-4: Analog Bandwidth116
Figure 4-9: Measurement of Analog Bandwidth118
Figure 4-10: Initial Test Hookup120
Figure 4-11: Measurement of Channel Delay - TDS 684B Shown122
Table 4-5: Delay between Channels Worksheet123
Figure 4-12: Initial Test Hookup124
Figure 4-13: Measurement of Accuracy - Long-Term and Delay Time126
Figure 4-14: Initial Test Hookup127
Triggering128
Figure 4-15: Measurement of Time Accuracy for Pulse and Glitch129
Figure 4-16: Initial Test Hookup130
Figure 4-17: Measurement of Trigger-Level Accuracy132
Figure 4-18: Initial Test Hookup135
Figure 4-19: Measurement of Trigger Sensitivity - 50 Mhz Results136
Figure 4-20: Initial Test Hookup139
Figure 4-21: Measurement of Main Trigger out Limits141
Figure 4-22: Initial Test Hookup143
Figure 4-23: Measurement of Probe Compensator Frequency145
Figure 4-24: Subsequent Test Hookup146
Figure 4-25: Measurement of Probe Compensator Amplitude147
Figure 4-26: Jitter Test Hookup149
Figure 4-27: Jitter Test Displayed Waveform - TDS 684B Shown150
Figure 4-28: Jitter Test When Completed - TDS 684B Shown151
Figure 4-29: Triggered Signal Range Test - 300 MV153
Oscilloscopes160
System172
Table 5-1: Calibration Tests173
Table 5-2: Adjustments Required for Module Replaced174
Table 5-3: Adjustments and Dependencies174
Table 5-4: Test Equipment, Fixtures, and Supplies175
Table 5-5: GPIB Board Configuration177

Tektronix TDS 520B - Figure 4-27: Jitter Test Displayed Waveform - TDS 684 B Shown

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