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Tektronix TDS 520B - Table of Contents

Tektronix TDS 520B
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Table of Contents
TDS 500B, 600B and TDS 700A Service Manual
iii
List of Figures
Figure 2–1: Map of Display Functions 2–8. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–1: Map of Display Functions 4–3. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–2: Verifying Adjustments and Signal-Path Compensation 4–6.
Figure 4–3: Universal Test Hookup for Functional Tests – TDS 600B
Shown 4–8. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–4: Measurement of DC Offset Accuracy at Zero Setting 4–29. . .
Figure 4–5: Initial Test Hookup 4–30. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–6: Measurement of DC Accuracy at Maximum Offset
and Position 4–32. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–7: Initial Test Hookup 4–34. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–8: Optional Initial Test Hookup 4–34. . . . . . . . . . . . . . . . . . . . . . .
Figure 4–9: Measurement of Analog Bandwidth 4–37. . . . . . . . . . . . . . . . .
Figure 4–10: Initial Test Hookup 4–39. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–11: Measurement of Channel Delay – TDS 684B Shown 4–41. .
Figure 4–12: Initial Test Hookup 4–43. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–13: Measurement of Accuracy — Long-Term and
Delay Time 4–45. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–14: Initial Test Hookup 4–46. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–15: Measurement of Time Accuracy for Pulse and Glitch
Triggering 4–48. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–16: Initial Test Hookup 4–49. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–17: Measurement of Trigger-Level Accuracy 4–51. . . . . . . . . . . .
Figure 4–18: Initial Test Hookup 4–54. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–19: Measurement of Trigger Sensitivity — 50 MHz Results
Shown on a TDS 684B Screen 4–55. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–20: Initial Test Hookup 4–58. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–21: Measurement of Main Trigger Out Limits 4–60. . . . . . . . . . .
Figure 4–22: Initial Test Hookup 4–62. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–23: Measurement of Probe Compensator Frequency 4–64. . . . .
Figure 4–24: Subsequent Test Hookup 4–65. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–25: Measurement of Probe Compensator Amplitude 4–66. . . . .
Figure 4–26: Jitter Test Hookup 4–68. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4–27: Jitter Test Displayed Waveform – TDS 684B Shown 4–69. .
Figure 4–28: Jitter Test When Completed – TDS 684B Shown 4–70. . . . .
Figure 4–29: Triggered Signal Range Test – 300 mV 4–72. . . . . . . . . . . . . .

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