Why does the specimen seem to be moving in my Zeiss Medical Equipment?
If the specimen appears to be moving, this could be due to charging effects. To resolve this, ensure proper conduction of the non-conducting specimen. Additionally, optimize specimen preparation or apply a charge compensation method.
General| Brand | Zeiss |
|---|---|
| Model | GeminiSEM Series |
| Category | Medical Equipment |
| Language | English |
Defines text formatting and link types used in the manual for clarity.
Explains signal words DANGER, WARNING, CAUTION, NOTICE and their meanings.
Lists other relevant documents and resources for users.
Provides contact information for ZEISS Sales & Service Partners and headquarters.
Details the intended applications of the microscope system, including imaging and analytics.
Outlines essential safety principles and requirements for operating the microscope system.
Summarizes potential hazards and recommended safety precautions for safe operation.
Describes warning labels and lights on the microscope system indicating potential hazards.
Explains safety devices and interlocks designed to prevent injuries and property damage.
Provides an overview of the main components of the SEM workstation.
Details the main physical components of the microscope system.
Describes the electron optics and components of the Gemini 1 column.
Details the electron optics and components of the Gemini 2 column.
Explains the electron optics and components of the Gemini 3 column.
Describes the different operating modes for the electron gun: Normal, Imaging, and Analytic.
Introduces the various detectors used for signal detection in SEM imaging.
Details the InLens SE detector for high-resolution SE imaging and surface topography.
Describes the Everhart-Thornley SE detector for detecting SE and BSE signals.
Describes the motorized eucentric specimen stage for specimen navigation.
Details the dual joystick used for stage control and specimen navigation.
Lists and describes optional components and accessories for the SEM.
Lists and describes various optional detectors available for the SEM.
Explains the Cascade Current Detector (C2D) for secondary electron imaging under variable pressure.
Details the VPSE detector for variable pressure applications and non-conducting specimens.
Describes the EsB detector for SE and BSE detection, enabling high contrast topography.
Explains the aBSD-LH detector for high efficiency material characterization at low kV.
Details the aBSD detector for material characterization and topographical contrast.
Guides on setting up the YAG BSD detector for high-speed imaging.
Details the AsB detector integrated into the Gemini lens for BSE detection at short working distances.
Describes the aSTEM detector for compositional and topographical imaging of ultrathin specimens.
Explains setting up the CL detector for structural examination.
Describes the control panel used for accessing frequently used functions.
Introduces the SmartSEM software, its user interface, and controls.
Details the graphical user interface (GUI) of the SmartSEM software.
Lists prerequisites for successful commissioning, including training and manual understanding.
Details the procedure for powering up and energizing the microscope system.
Guides users on launching and logging into the SmartSEM software.
Provides a step-by-step guide to acquiring an SEM image using the SE detector.
Covers adjusting gun parameters to optimize the electron beam.
Discusses aperture configurations and beam modes for optimizing SEM performance.
Guides on selecting and setting up appropriate detectors for different applications.
Covers operating the microscope in variable pressure modes for non-conducting specimens.
Guides users through the process of safely shutting down the microscope system.
Outlines the procedure for performing an emergency shutdown of the microscope.
Emphasizes safety precautions during cleaning and maintenance tasks.
Provides recommended intervals for preventive maintenance based on system uptime.
Specifies that maintenance work should only be performed by authorized ZEISS personnel.
Outlines general care and cleaning procedures, stressing authorized personnel for non-described tasks.
Addresses troubleshooting issues related to the overall system and its components.
Focuses on troubleshooting issues related to the specimen chamber.
Focuses on troubleshooting issues related to the electron optical column.
Covers troubleshooting related to the microscope's power circuit and circuit breakers.
Addresses troubleshooting and maintenance for various detectors.
Covers maintenance and cleaning of the microscope apertures.
Provides guidance on maintaining the PC connected to the microscope.
Outlines the process for shutting down and securing the system for extended periods.
Details procedures and precautions for transporting and storing the microscope system.
Explains the proper disposal methods for the microscope system and its components.
Illustrates the physical layout and connections of the microscope system.
Lists performance data and specifications for the GeminiSEM 360 model.
Lists performance data and specifications for the GeminiSEM 460 model.
Lists performance data and specifications for the GeminiSEM 560 model.
Details the requirements for installing the microscope system, including site and environmental needs.
Lists relevant safety, environmental, and EMC standards the system complies with.
Details the tools and accessories provided with the GeminiSEM, including the beamsleeve kit.
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