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General| Detector | Flat Panel Detector |
|---|---|
| Measurement volume | Varies based on configuration |
| Maximum scan volume | Varies based on configuration |
| Maximum Sample Size | Varies based on configuration |
| Maximum Sample Weight | Varies based on configuration |
| Software | ZEISS METROTOM OS |
| Applications | Dimensional metrology, defect analysis, material analysis, reverse engineering |
| Type | Industrial X-ray computed tomography (CT) system |
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