longer than the carrier accelerated trip (TRIP) recorded for the permissive
overreach scheme communication.
5. Restore the forward and reverse zone timer to its original setting.
11.11.3.2
Weak end infeed logic
M14947-37 v2
Weak-end infeed logic at permissive overreach schemes
M14947-39 v5
1. Check the blocking of the echo with the injection of a CRL signal >40ms
after a reverse fault is applied.
2. Measure the duration of the echoed CS signal by applying a CRL receive
signal.
3. Check the trip functions and the voltage level for trip by reducing a phase
voltage and applying a CRL receive signal.
Testing conditions
M14947-52 v7
Only one type of fault is sufficient, with the current reversal and weak-end infeed
logic for distance protection function ZCRWPSCH. Apply three faults (one in each
phase). For phase L1-N fault, set these parameters:
Table 38: Phase L1-N parameter values
Phase I (Amps) Phase-angle (Deg) V (Volts) Phase-angle (Deg)
L1 0 0 Set less than
UPN<
0
L2 0 240 63 240
L3 0 120 63 120
If wanted, change all settings cyclically for other faults (L2-N and L3-N).
The setting parameter WEI is set to Echo & Trip
.
1. Apply input signals according Table
38.
2. Activate the receive (CR) signal.
3.
After the IED has operated, turn off the input signals.
4. Check that trip, send signal, and indication are obtained.
The ECHO output gives only a 200 ms pulse.
11.11.3.3 Completing the test
M14947-105 v5
Continue to test another function or end the test by changing the TESTMODE
setting to Off. Restore connections and settings to their original values, if they were
changed for testing purposes.
Section 11 1MRK 505 378-UEN A
Testing functionality by secondary injection
242 Line differential protection RED670 2.2 IEC
Commissioning manual
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