Chauvin Arnoux F09 - 3.5 Semiconductor Test; 3.6 Current Measurements

33
Display range 400 Ω 4000 Ω 40 kΩ
Measuring range 0.0 to 400 to 4.00 kΩ to
399.9 Ω 3999 Ω 39.99 kΩ
Accuracy (1): 1% L + 2 pt
Resolution 0.1 Ω 1 Ω 10 Ω
Open circuit voltage ≤ 3.2 V
Measuring current 320 µA 40 µA
Protection 500 V AC or 750 V (DC or peak)
(1) With compensation for measurement cable resistance
■■
■■
■ MIN/ MAX Mode:
- Accuracy: same as previous table +0.2% L
- Capture time: 100 ms typ.
3.5 Semi-Conductor Test ( )
1. Connect the measurement leads to the instrument’s
terminals, complying with the polarities indicated: red lead
on the “+” terminal and black lead on the “COM” terminal.
2. Set the rotary switch to " " position and press twice
on the yellow key: The symbol is displayed.
3. Connect the unit to the semi-conductor (junction) to be
tested.
The measurement current moves from the “+” terminals to
the “COM” terminal. It corresponds to the direct testing of
the semi-conductor junction.
- Short-circuit junction: audio indication for a threshold <
0.050 V
- Cut or reversed junction (or threshold > 3.2 V) : OL
displayed
Display range 4 V
Measuring range 0 to 3.199 V
Accuracy 1% L +2 pt
Resolution 1 mV
Measuring current (1) 2 mA to 4 mA
Protection 500 V AC or 750 V (DC or peak)
(1) Per the voltage measured
■■
■■
■ MIN/ MAX Mode:
- Accuracy: same as previous table +0.2% L
- Capture time: 100 ms typ.
3.6 Current measurements (A)
1. Set the rotary switch to position "A "
2. Clamp the conductor carrying the current to be measured,
check for proper closing of the jaws and for foreign bodies
in the gap.
For DC, the “➭” arrow engraved on the jaws must be directed
in the presumed direction of current circulation for the sign
of the displayed value to be significant.