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5) Flat-field
Different modules in a multi-module detector differ in sensitivity. This
calibration needs to be done as a function of beam energy.
The flat field map can be loaded into the detector controller, and perform the
correction as the data are read; however, once corrected it is difficult to go
back.
Alternatively, crystallographic processing programs like XDS develop a flat-
field calibration internally as they process. Giving such programs a good
starting point for the refinement is presumably the better approach.
6) Bad pixels
The software permits reading of a bad pixel mask, which pixels are flagged as
-2 in the data. This can be good or bad since once the pixel is flagged, the
data are lost. It is also easy to incorporate these data as a post-acquisition
step. The gaps between the modules can optionally be flagged with -1 (zero is
the default). Both of these flags are used by XDS.
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