Ā© 2014 Digi International Inc. 64
XBee/XBee-PRO
Ā®
DigiMesh 2.4 User Manual
I/O Settings
ATļ
Command
Name and Description
Parameter
Range
Default
IC
I/O Digital Change Detection. Set/Read the digital I/O
pins to monitor for changes in the I/O state. IC works with
the individual pin configuration commands (D0-D9, P0-
P2). If a pin is enabled as a digital input/output, the IC
command can be used to force an immediate I/O sample
transmission when the DIO state changes. IC is a bitmask
that can be used to enable or disable edge detection on
individual channels. Unused bits should be set to 0.
Bit (I/O pin):
0 (DIO0)
1 (DIO1)
2 (DIO2)
3 (DIO3)
4 (DIO4)
5 (DIO5)
6 (DIO6)
7 (DIO7)
8 (DIO8)
9 (DIO9)
10 (DIO10)
11 (DIO11)
12 (DIO12)
0-0xFFFF 0
IF
Sleep Sample Rate.Set/read the number of sleep cycles
that must elapse between periodic I/O samples. This
allows I/O samples to be taken only during some wake
cycles. During those cycles I/O samples are taken at the
rate specified by IR.
1-0xFF 1
IR
IO Sample Rate. Set/Read the I/O sample rate to
enable periodic sampling. For periodic sampling to be
enabled, IR must be set to a non-zero value, and at least
one module pin must have analog or digital I/O
functionality enabled (see D0-D9, P0-P2 commands). The
sample rate is measured in milliseconds.
0 - 0xFFFF (ms) 0
IS
Force Sample. Forces a read of all enabled digital and
analog input lines.
n/a n/a
1S
XBee Sensor Sample. Forces a sample to be taken on
an XBee Sensor device. This
command can only be issued to an XBee Sensor device
using an API remote command
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