Fuji Electric ZKJ Series - Page 20

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3.4 Sampling
3.4.1 Conditions of sampling gas
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of drain in the gas analyzer. If vapor is contained in the sampling gas, dew point should be
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mist.
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2
, F
2
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able amounts, will shorten the life of instruments.
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of hot gas directly into the instrument.
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3.4.3 Preparation of standard gas
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condition (once a week). Prepare a standard gas cylinder for zero calibration and span calibration.
Analyzer without O
2
measurement
Analyzer with built-in O
2
sensor
Analyzer with external
zirconia O
2
sensor
=HURJDV N
2
gas or dry air N
2
gas 'U\DLUDWPRVSKHULFDLURU
gas with a concentration of
RUPRUHRIIXOOVFDOH
Span gas other than
for O
2
measurement
Gas with concentration of
RUPRUHRIIXOOVFDOH
Gas with concentration of
RUPRUHRIIXOOVFDOH
Gas with concentration of
RUPRUHRIIXOOVFDOH
Span gas for O
2
measurement
Gas with concentration of
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2
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2
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2
in at-
mospheric air is considerable.
3.4.4 Purging of instrument inside
The inside of instrument need not be purged generally except for the following cases.
(1) A combustible gas component is contained in sampling gas.
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tion site.
In such cases as above, the inside of analyzer should be purged with the air for instrumentation
or N
2
.
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If dust or mist is contained in purging gas, it should be eliminated completely in advance.