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Procedures for measuring Icbo, Ices, and Iceo leakage currents for transistors.
Procedures for measuring Igss and Idss leakage currents for FETs.
Procedures for measuring Icbo, Ices, and Iceo leakage currents for transistors.
Procedures for measuring Igss and Idss leakage currents for FETs.
| Model | IT-3120 |
|---|---|
| Manufacturer | Heathkit |
| Category | Test Equipment |
| Power Supply | 120V AC, 60 Hz |
| Inductance Range | 0.1 μH to 1000 H |
| Resistance Range | 0.1 Ohm to 10 MOhm |
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