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Hioki CHT3548 - Page 47

Hioki CHT3548
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Hope Electronics Technology Manual Edition V1.0 47
l Even in a connection completely free from abnormality, a relatively high resistance
may be indicated at a lower measurement current. This is due to an oxide film that is
generated around the contact while it is not used.
l Even when it is judged that no abnormality is found using a small current, the
connection sections are occasionally melted when a large current flows. This
problem occurs due to the Joule heat generated by a large current when a high
resistance area is created locally.

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