Huawei ME909 Series - Reliability Features

HUAWEI ME909 Series LTE LGA Module
Hardware Guide
Electrical and Reliability Features
Issue V0.3 (2013-05-21)
Huawei Proprietary and Confidential
Copyright © Huawei Technologies Co., Ltd.
58
Table 5-11 DC power consumption (GPS)
Description
Max Test Value
Units
Configuration
GPS location request
TBD
mA

The above values are the average of some test samples.

LTE test condition: 10 MHz bandwidth, QPSK, 1RB when testing max Tx power and full RB
when testing 1 dBm or 10 dBm.
5.7 Reliability Features
Table 5-12 lists the test conditions and results of the reliability of the ME909 module.
Table 5-12 Test conditions and results of the reliability of the ME909 module
Item
Test Condition
Standard
Low-temperature
storage
Temperature: –40ºC±2ºC
Test duration: 24 h
IEC60068
High-temperature
storage
Temperature: 85ºC±2ºC
Test duration: 24 h
IEC60068
Low-temperature
working
Temperature: –30ºC ±2ºC
Test duration: 24 h
IEC60068
High-temperature
working
Temperature: 75ºC ±2ºC
Test duration: 24 h
IEC60068
Damp heat cycling
High temperature: 55ºC ±2ºC
Low temperature: 25ºC ±2ºC
Humidity: 95%
Repetition times: 4
Test duration: 12 h+12 h
IEC60068
Temperature shock
Low temperature: –40ºC ±2ºC
High temperature: 85ºC ±2ºC
Temperature change interval: < 30s
Test duration: 15 min
Repetition times: 100
IEC60068