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Details the safety aspects of the scanning electron microscope, noting minimal risks to the operator.
Explains the principles of SEM, its advantages over optical microscopes, and common attachments.
Describes the available sample holders and the general requirements for sample mounting.
Provides step-by-step instructions for preparing and attaching conductive samples to holders.
Outlines the procedure for preparing non-conductive samples, including sputter coating.
Guide to powering up the scanning electron microscope and its associated computer.
Detailed steps for safely venting, opening, loading, and adjusting the sample in the SEM chamber.
Instructions for launching SEM software and acquiring a focused image of the specimen.
Explains how to navigate the specimen stage using motorized controls and fine adjustments.
Details on adjusting scan rates for optimal image quality and acquisition speed.
Instructions for changing specimen magnification using controls on the keypad and toolbar.
Overview of additional toolbar functions, including gun settings, recipes, and chamber control.
Procedure for safely powering down the electron gun and exiting the SEM software.
Presents a table of commonly used options for acquiring digital SEM images.
Guide to capturing fast, lower-resolution images using specific scan modes.
Instructions for acquiring detailed, high-resolution images with longer scan times.
General| Type | Scanning Electron Microscope (SEM) |
|---|---|
| Accelerating Voltage | 0.5 to 30 kV |
| Magnification | 5x to 300, 000x |
| Detectors | Secondary Electron Detector (SED), Backscattered Electron Detector (BSED) |
| Electron Source | Tungsten (W) filament |
| Stage | Motorized stage with X, Y, Z, tilt, and rotation |
| Vacuum Mode | High vacuum, low vacuum |
| Vacuum System | Turbo molecular pump |
| Image Storage | Digital image storage |
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