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Instructions for placing a grid into the specimen rod holder, including orientation and wing key usage.
Setting the tilt of the insertion chamber to the zero position and securing the lock.
Aligning the grid holder pin with the goniometer slot and inserting the rod.
Turning on HT/FIL, checking readiness, and opening ITEM software for image acquisition.
Adjusting magnification, focusing, using XY controls, and applying wobbler for image stability.
Setting exposure levels, adjusting histogram, and saving images with scale bars.
Procedure for adjusting upper and lower condenser diaphragms for beam control.
Making the filament visible and adjusting it to remove pin shadow.
Adjusting Fresnel fringes on a test grid and correcting astigmatism.
Detailed alignment steps for assistants using a holy grid for beam centering.
Resolving issues like lost camera vision and vacuum loss during rod insertion.
Concluding the session by switching off components and safely unloading the specimen holder.
Monitoring pumping system status and resolving bright spot issues on the screen.
This document outlines the operational procedures and maintenance considerations for the JEOL 1010 Transmission Electron Microscope (TEM), specifically tailored for GI use. The TEM is a sophisticated instrument designed for high-resolution imaging of specimens by transmitting a beam of electrons through them.
The JEOL 1010 TEM functions by generating an electron beam, which is then focused and directed through a thin specimen. The electrons interact with the specimen, and the transmitted electrons are then magnified and projected onto a phosphorescent screen, creating a visible image. Alternatively, a digital camera (CCD) can capture and archive the images. The TEM allows for detailed observation of the internal structure of materials at a very high magnification, providing insights into their morphology, composition, and crystallographic information. Key functions include specimen loading, viewing, image acquisition, and various alignment procedures to optimize image quality.
This comprehensive guide ensures proper operation and basic troubleshooting for the JEOL 1010 TEM, facilitating high-quality imaging and analysis.
| Type | Transmission Electron Microscope (TEM) |
|---|---|
| Electron Source | Tungsten filament |
| Accelerating Voltage | 40, 60, 80, 100 kV |
| Resolution | 0.5 nm |
| Magnification | 50x - 600, 000x |
| Specimen Size | 3 mm diameter |
| Detector | Fluorescent screen, CCD camera |
| Imaging Modes | Bright field, Dark field |
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