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JEOL JEM-2100F - User Manual

JEOL JEM-2100F
129 pages
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JEM
-
2100F
FIELD EMISSION
ELECTRON
MICROSCOPE
For the proper use of the instrument, be sure to
read this instruction manual. Even after you
read it, please keep the manual on hand so that
you can consult it whenever necessary.
IEM210F-1 (17200)
APR2003-01120554
Printed in Japan
INSTRUCTIONS

Table of Contents

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Summary

Notational Conventions and Glossary

General Notations

Defines symbols and terms used for safety and operations.

Safety Precautions

Essential Safety Guidelines

Provides critical safety information regarding hazards, warnings, and cautions for instrument use.

General Information

Key Features of JEM-2100 F

Highlights the main features and improvements of the JEM-2100F microscope.

Specifications

Performance and Optical System Specifications

Details performance ranges, electron optical components, and system capabilities.

Installation and System Requirements

Outlines necessary environmental conditions, power, water, gas supplies, and warranty information.

Composition and Construction

Microscope Column Structure and Components

Illustrates and describes the physical composition and internal structure of the microscope column and its parts.

Control Panel Locations and System Diagrams

Identifies control panel positions and illustrates system layouts and ray diagrams.

Description of Controls

Control Panels and Their Functions

Explains the operation of various control panels (L1, R1, L2, R2, SC, Power Supply) and their specific functions.

Monitor Displays and PC Interface

Details monitor display screens, PC interface, software menus, and specific screen functions for operation and status monitoring.

Operation

Basic Operation: Startup, Shutdown, and Beam Generation

Guides users through essential procedures like starting up, shutting down, and generating the electron beam.

Image Acquisition and Observation

Covers procedures for photographing, image observation techniques, and film processing.

Advanced Imaging and Diffraction

Explains special observations like bright/dark field imaging, diffraction methods, and minimum dose exposure.

Appendix

Periodic Maintenance and Parts Information

Lists parts for periodic exchange, specifications, and details on vacuum pump systems and maintenance.

JEOL JEM-2100F Specifications

General IconGeneral
BrandJEOL
ModelJEM-2100F
CategoryMicroscope
LanguageEnglish

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