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Type | Scanning Probe Microscope (SPM) |
---|---|
Model | JSPM-5200 |
Manufacturer | JEOL |
Resolution (Z) | 0.1 nm |
Laser Wavelength | 670 nm |
Maximum Sample Size | 20 mm diameter, 10 mm height |
Scan Range (Z) | 10 μm |
Modes of Operation | Contact mode, Tapping mode, Non-contact mode |
Vibration Isolation | Active Vibration Isolation |
Operating Environment Temperature | 15-30 °C |
Operating Environment Humidity | 30-70 % |
Power Requirements | 100 V - 240 V AC, 50/60 Hz |