Keithley Series 2600

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2-8

SECTION 2

Two-terminal Device Tests

Table of Contents

Default Chapter2
- Table of Contents2
- List of Illustrations6
Introduction8
Hardware Configuration8
- System Configuration8
- Figure 1-1. Typical System Configuration for Applications8
- Remote/Local Sensing Considerations9
- Section 1 General Information8
Graphing9
Introduction10
- Section 2 Two-Terminal Device Tests10
Instrument Connections10
Voltage Coefficient Tests of Resistors10
- Test Configuration10
- Voltage Coefficient Calculations10
- Typical Program 1 Results12
- Program 1 Description12
Capacitor Leakage Test12
- Test Configuration12
- Leakage Resistance Calculations12
- Figure 2-3. Test Configuration for Capacitor Leakage Test12
- Measurement Considerations13
- Example Program13
  - Capacitor Leakage Test13
- Typical Program 2 Results13
- Program 2 Description14
Diode Characterization14
- Test Configuration14
- Measurement Considerations14
- Example Program 314
Introduction18
- Section 3 Bipolar Transistor Tests18
Instrument Connections18
- Common-Emitter Characteristics18
- Figure 3-1. Test Configuration for Common-Emitter Tests18
- Test Configuration19
- Measurement Considerations19
- Example Program19
Common-Emitter Characteristics19
- Typical Program 4 Results20
- Program 4 Description20
- Gummel Plot20
Current Gain23
- Gain Calculations23
- Test Configuration for Search Method23
- Measurement Considerations23
- Example Program 6A: DC Current Gain Using Search Method23
- Figure 3-5 . Test Configuration for Current Gain Tests23
- Typical Program 6A Results24
- Program 6A Description24
- Modifying Program 6A24
- Configuration for Fast Current Gain Tests25
- Example Program 6B: DC Current Gain Using Fast Method25
- Figure 3-6. Test Configuration for Fast Current Gain Tests25
- Program 6B Description26
- Example Program 7: AC Current Gain26
- Typical Program 7 Results27
- Program 7 Description27
- Modifying Program 727
- Transistor Leakage Current27
  - Test Configuration27
  - Example Program 8: I28
Common-Source Characteristics30
- Test Configuration30
- Example Program 9: Common-Source Characteristics30
- Typical Program 9 Results31
- Program 9 Description31
- Figure 4-1. Test Configuration for Common-Source Tests31
- Modifying Program 932
- Section 4 FET Tests30
  - Introduction30
  - Instrument Connections30
Transconductance Tests32
- Test Configuration32
- Figure 4-2 . Program 9 Results: Common-Source32
- Example Program 10: Transconductance33
  - Vs . Gate Voltage Test33
  - Figure 4-3. Configuration for Transductance Tests33
- Typical Program 10 Results34
- Program 10 Description34
- Figure 4-4. Program 10 Results: Transconductance Vs. V34
- Figure 4-5 . Program 10 Results: Transconductance Vs34
Threshold Tests35
- Search Method Test Configuration35
- Example Program 11A: Threshold Voltage35
- Figure 4-6 . Configuration for Search Method35
- Program 11A Description36
- Modifying Program 11A36
- Self-Bias Threshold Test Configuration36
- Example Program 11B: Self-Bias37
  - Threshold Voltage Tests37
  - Figure 4-7. Configuration for Self-Bias Threshold Tests37
- Program 11B Description38
- Modifying Program 11B38
Introduction40
- Section 5 Using Substrate Bias40
Substrate Bias Instrument Connections40
- Figure 5-1. TSP-Link Connections for Two Instruments40
- Example Program 12: Substrate Current Vs. Gate-Source Voltage41
- Figure 5-2. TSP-Link Instrument Connections41
- Program 12 Test Configuration41
- Source-Measure Unit Substrate Biasing41
- Voltage Source Substrate Bias Connections41
- Figure 5-3. Program 12 Test Configuration42
- Figure 5-4. Program 12 Typical Results: I43
- Program 12 Description43
- Typical Program 12 Results43
- Example Program 13: Common-Source Characteristics with Source-Measure Unit44
- Modifying Program 1244
- Program 13 Test Configuration44
- Modifying Program 1346
- Program 13 Description46
- Typical Program 13 Results46
5.3 Source-Measure Unit Substrate Biasing. . . . .5-241
BJT Substrate Biasing46
- Program 14 Test Configuration46
- Example Program 14: Common-Emitter46
- Figure 5-7. Program 14 Test Configuration47
- Typical Program 14 Results48
  - Program 14 Description48
  - Figure 5-8. Program 14 Typical Results: Common-Emitter Characteristics with Substrate Bias48
Introduction50
- Program 15 Test Configuration50
- Example Program 15: High Current50
- Source and Voltage Measure50
- Figure 6-1. High Current (Smus in Parallel)50
- Program 15 Description51
- Section 6 High Power Tests50
Instrument Connections51
- Program 16 Test Configuration51
- Example Program 16: High Voltage Source and Current Measure51
- Figure 6-2. High Voltage (Smus in Series)51
- Program 16 Description52
Appendix A Scripts54
Section 2. Two-Terminal Devices54
- Program 1. Voltage Coefficient of Resistors54
- Program 2. Capacitor Leakage Test58
- Program 3. Diode Characterization61
- Program 3A. Diode Characterization Linear Sweep61
- Program 3B. Diode Characterization Log Sweep64
- Program 3C. Diode Characterization Pulsed Sweep67
Section 3. Bipolar Transistor Tests72
- Program 4. Common-Emitter Characteristics72
- Program 5. Gummel Plot77
Section 6. High Power Tests81
- Program 6. Current Gain81
- Program 6A . Current Gain (Search Method81
- Program 6B . Current Gain (Fast Method85
- Program 7. AC Current Gain89
- Program 8 . Transistor Leakage (ICEO92
Section 4. FET Tests96
- Program 9. Common-Source Characteristics96
- Program 10. Transconductance101
- Program 11. Threshold105
- Program 11A . Threshold (Search105
- Program 11B . Threshold (Fast109
Section 5. Using Substrate Bias113
- Program 12 . Substrate Current Vs . Gate-Source113
Section 6. High Power Tests131
- Current Measurement133

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