Keithley Series 2600 User Manual

Name: Keithley Series 2600
Brand: Keithley
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136 pages

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2-8

SECTION 2

Two-terminal Device Tests

Default Chapter2
- Table of Contents2
- List of Illustrations6
Introduction8
Hardware Configuration8
- System Configuration8
- Figure 1-1. Typical System Configuration for Applications8
- Remote/Local Sensing Considerations9
- Section 1 General Information8
Graphing9
Introduction10
- Section 2 Two-Terminal Device Tests10
Instrument Connections10
Voltage Coefficient Tests of Resistors10
- Test Configuration10
- Voltage Coefficient Calculations10
- Typical Program 1 Results12
- Program 1 Description12
Capacitor Leakage Test12
- Test Configuration12
- Leakage Resistance Calculations12
- Figure 2-3. Test Configuration for Capacitor Leakage Test12
- Measurement Considerations13
- Example Program13
  - Capacitor Leakage Test13
- Typical Program 2 Results13
- Program 2 Description14
Diode Characterization14
- Test Configuration14
- Measurement Considerations14
- Example Program 314
Introduction18
- Section 3 Bipolar Transistor Tests18
Instrument Connections18
- Common-Emitter Characteristics18
- Figure 3-1. Test Configuration for Common-Emitter Tests18
- Test Configuration19
- Measurement Considerations19
- Example Program19
Common-Emitter Characteristics19
- Typical Program 4 Results20
- Program 4 Description20
- Gummel Plot20
Current Gain23
- Gain Calculations23
- Test Configuration for Search Method23
- Measurement Considerations23
- Example Program 6A: DC Current Gain Using Search Method23
- Figure 3-5 . Test Configuration for Current Gain Tests23
- Typical Program 6A Results24
- Program 6A Description24
- Modifying Program 6A24
- Configuration for Fast Current Gain Tests25
- Example Program 6B: DC Current Gain Using Fast Method25
- Figure 3-6. Test Configuration for Fast Current Gain Tests25
- Program 6B Description26
- Example Program 7: AC Current Gain26
- Typical Program 7 Results27
- Program 7 Description27
- Modifying Program 727
- Transistor Leakage Current27
  - Test Configuration27
  - Example Program 8: I28
Common-Source Characteristics30
- Test Configuration30
- Example Program 9: Common-Source Characteristics30
- Typical Program 9 Results31
- Program 9 Description31
- Figure 4-1. Test Configuration for Common-Source Tests31
- Modifying Program 932
- Section 4 FET Tests30
  - Introduction30
  - Instrument Connections30
Transconductance Tests32
- Test Configuration32
- Figure 4-2 . Program 9 Results: Common-Source32
- Example Program 10: Transconductance33
  - Vs . Gate Voltage Test33
  - Figure 4-3. Configuration for Transductance Tests33
- Typical Program 10 Results34
- Program 10 Description34
- Figure 4-4. Program 10 Results: Transconductance Vs. V34
- Figure 4-5 . Program 10 Results: Transconductance Vs34
Threshold Tests35
- Search Method Test Configuration35
- Example Program 11A: Threshold Voltage35
- Figure 4-6 . Configuration for Search Method35
- Program 11A Description36
- Modifying Program 11A36
- Self-Bias Threshold Test Configuration36
- Example Program 11B: Self-Bias37
  - Threshold Voltage Tests37
  - Figure 4-7. Configuration for Self-Bias Threshold Tests37
- Program 11B Description38
- Modifying Program 11B38
Introduction40
- Section 5 Using Substrate Bias40
Substrate Bias Instrument Connections40
- Figure 5-1. TSP-Link Connections for Two Instruments40
- Example Program 12: Substrate Current Vs. Gate-Source Voltage41
- Figure 5-2. TSP-Link Instrument Connections41
- Program 12 Test Configuration41
- Source-Measure Unit Substrate Biasing41
- Voltage Source Substrate Bias Connections41
- Figure 5-3. Program 12 Test Configuration42
- Figure 5-4. Program 12 Typical Results: I43
- Program 12 Description43
- Typical Program 12 Results43
- Example Program 13: Common-Source Characteristics with Source-Measure Unit44
- Modifying Program 1244
- Program 13 Test Configuration44
- Modifying Program 1346
- Program 13 Description46
- Typical Program 13 Results46
5.3 Source-Measure Unit Substrate Biasing. . . . .5-241
BJT Substrate Biasing46
- Program 14 Test Configuration46
- Example Program 14: Common-Emitter46
- Figure 5-7. Program 14 Test Configuration47
- Typical Program 14 Results48
  - Program 14 Description48
  - Figure 5-8. Program 14 Typical Results: Common-Emitter Characteristics with Substrate Bias48
Introduction50
- Program 15 Test Configuration50
- Example Program 15: High Current50
- Source and Voltage Measure50
- Figure 6-1. High Current (Smus in Parallel)50
- Program 15 Description51
- Section 6 High Power Tests50
Instrument Connections51
- Program 16 Test Configuration51
- Example Program 16: High Voltage Source and Current Measure51
- Figure 6-2. High Voltage (Smus in Series)51
- Program 16 Description52
Appendix A Scripts54
Section 2. Two-Terminal Devices54
- Program 1. Voltage Coefficient of Resistors54
- Program 2. Capacitor Leakage Test58
- Program 3. Diode Characterization61
- Program 3A. Diode Characterization Linear Sweep61
- Program 3B. Diode Characterization Log Sweep64
- Program 3C. Diode Characterization Pulsed Sweep67
Section 3. Bipolar Transistor Tests72
- Program 4. Common-Emitter Characteristics72
- Program 5. Gummel Plot77
Section 6. High Power Tests81
- Program 6. Current Gain81
- Program 6A . Current Gain (Search Method81
- Program 6B . Current Gain (Fast Method85
- Program 7. AC Current Gain89
- Program 8 . Transistor Leakage (ICEO92
Section 4. FET Tests96
- Program 9. Common-Source Characteristics96
- Program 10. Transconductance101
- Program 11. Threshold105
- Program 11A . Threshold (Search105
- Program 11B . Threshold (Fast109
Section 5. Using Substrate Bias113
- Program 12 . Substrate Current Vs . Gate-Source113
Section 6. High Power Tests131
- Current Measurement133

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Keithley Series 2600 Specifications

General

Model	Series 2600
Measurement Functions	Voltage, Current, Resistance, Power
Resolution	Up to 6.5 digits
Current Source Range	Up to 10A
Communication Interfaces	GPIB, USB
Applications	Semiconductor testing
Category	Source Measure Unit (SMU)
Channels	Single or Dual Channel (varies by model)