Page 2
Find us at www.keysight.com
Ordering guide
Standard furnished item
1
Description Additional information
Installation guide Contains the information necessary to start up with the E5061B.
CD ROM IO libraries
Power cable
Certificate of calibration
Step 1. Choose test set option (must choose one of the nine test set options.)
Option No. Description
50 Ω RF NA options
E5061B-115 Transmission/Reflection test set, 100 kHz to 1.5 GHz, 50 Ω system impedance
E5061B-215 S-parameter test set, 100 kHz to 1.5 GHz, 50 Ω system impedance
E5061B-135 Transmission/Reflection test set, 100 kHz to 3 GHz, 50 Ω system impedance
E5061B-235 S-parameter test set, 100 kHz to 3GHz, 50 Ω system impedance
75 Ω RF NA options
E5061B-117 Transmission/Reflection test set, 100 kHz to 1.5 GHz, 75 Ω system impedance
E5061B-217 S-parameter test set, 100 kHz to 1.5 GHz, 75 Ω system impedance
E5061B-137 Transmission/Reflection test set, 100 kHz to 3 GHz, 75 Ω system impedance
E5061B-237 S-parameter test set, 100 kHz to 3GHz, 75 Ω system impedance
LF-RF NA option
2
E5061B-3L3 LF-RF network analyzer with DC bias source, 5 Hz to 500 MHz
E5061B-3L4 LF-RF network analyzer with DC bias source, 5 Hz to 1.5 GHz
E5061B-3L5 LF-RF network analyzer with DC bias source, 5 Hz to 3 GHz
Step 2. Choose impedance analysis option
(for E5061B-3L5 LF-RF network analyzer. If not required, go to step 3.)
Option No. Description
Software option
E5061B-005
3, 4
Impedance analysis for E5061B-3L3/3L4/3L5 LF-RF network analyzer
Accessory
E5061B-720
4, 5
Add 50 Ω resistor set
The following steps will guide you through configuring your E5061B.
1. Keyboard and mouse are not furnished as standard. Refer to “Step 6. accessory option” for the selection of these items.
2. The E5061B-3L3/3L4/3L5 includes the 50 ohm S-parameter test set (5 Hz to 500 M/1.5 G/3 GHz), and the gain-phase test port (5 Hz to 30 MHz)
3. This option is not applicable for the E5061B RF NA options 1x5/2x5/1x7/2x7.
4. Refer to “Upgrade Kit” section for retrofit information on the above option.
5. For calibration at test fixtures. Required for the gain-phase series-thru method.