Index
National Instruments Corporation I -9 DAQCard E Series User Manual
T
technical support, F-1 to F-2
temperature
DAQCard-AI-16E-4, A-7
DAQCard-AI-16XE-50, A-12
theory of operation.
See hardware overview
.
timebases, 3-14
timing connections, 4-22 to 4-43
data acquisition timing connections, 4-24
to 4-36
AIGATE signal, 4-34 to 4-35
CONVERT* signal, 4-33 to 4-34
EXTSTROBE* signal, 4-27
SCANCLK signal, 4-26
SISOURCE signal, 4-35
STARTSCAN signal, 4-30 to 4-33
TRIG1 signal, 4-27 to 4-28
TRIG2 signal, 4-29 to 4-30
typical posttriggered acquisition
(figure), 4-25
typical pretriggered acquisition
(figure), 4-25
UISOURCE signal, 4-36
general-purpose timing signal
connections, 4-37 to 4-43
FREQ_OUT signal, 4-43
GPCTR0_GATE signal, 4-38
GPCTR0_OUT signal, 4-38 to 4-39
GPCTR0_SOURCE signal, 4-37 to
4-38
GPCTR0_UP_DOWN signal, 4-39
GPCTR1_GATE signal, 4-40 to 4-41
GPCTR1_OUT signal, 4-41
GPCTR1_SOURCE signal, 4-39
to 4-40
GPCTR1_UP_DOWN signal, 4-42
to 4-43
programmable function input
connections, 4-24
questions about, D-3 to D-5
timing I/O connections (figure), 4-23
timing I/O specifications
DAQCard-AI-16E-4, A-5 to A-6
DAQCard-AI-16XE-50, A-11 to A-12
timing signal routing, 3-13 to 3-14
CONVERT* signal routing (figure), 3-13
DAQCard clocks, 3-14
programmable function inputs, 3-14
transfer characteristic specifications
DAQCard-AI-16E-4, A-3
DAQCard-AI-16XE-50, A-9
TRIG1 signal
input timing (figure), 4-28
output timing (figure), 4-28
timing connections, 4-27 to 4-28
TRIG2 signal
input timing (figure), 4-30
output timing (figure), 4-30
timing connections, 4-29 to 4-30
triggers
analog, 3-9 to 3-12
above-high-level triggering mode
(figure), 3-10
below-low-level triggering mode
(figure), 3-10
block diagram, 3-9
high-hysteresis triggering
mode, 3-11
inside-region triggering mode
(figure), 3-11
low-hysteresis triggering mode, 3-12
specifications for
DAQCard-AI-16E-4, A-6
digital trigger specifications
DAQCard-AI-16E-4, A-6
DAQCard-AI-16XE-50, A-12
questions about, D-3
troubleshooting.
See questions and answers.
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