Tektronix TDS 520B

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Operating Instructions

2–10

TDS 500B, 600B and TDS 700A Service Manual

2. Select the waveform source(s). Position, scale, and set trigger level for

waveform source(s) directly from the front panel. The steps that follow

provide examples of possible control selections.

123

a. Input waveforms into these channels (7). Example: CH 1.

b. Push any channel’s button (8) to display its waveform. The last channel

turned on determines which waveform is positioned and scaled. The

indicator above the channel last selected is lighted.

Example: Push CH 1; then CH 2.

c. Vertically (1) and horizontally (2) scale and position the waveform(s)

selected. Example: Set the scale to 100 mV/div and center the waveform

on screen.

d. Stop and start acquiring waveforms (3). Example: Push RUN/STOP if

not acquiring.

Main Page

Table of Contents8
Table 1-1: Key Features of the TDS 500B, 600B and 700A29
Table 1-2: Record Length Vs. Divisions Per Record, Samples Per31
Table 1-3: Nominal Traits - Signal Acquisition System37
Table 1-4: Nominal Traits - Time Base System38
Table 1-5: Nominal Traits - Triggering System39
Table 1-6: Nominal Traits - Display System40
Table 1-7: Nominal Traits - GPIB Interface, Output Ports, and Power Fuse40
Table 1-8: Nominal Traits - Data Handling and Reliability40
Table 1-9: Nominal Traits - Mechanical41
Table 1-10: Warranted Characteristics - Signal Acquisition44
Table 1-11: Warranted Characteristics - Time Base System45
Table 1-12: Warranted Characteristics - Triggering System46
Table 1-13: Warranted Characteristics - Output Ports, Probe46
Table 1-14: Warranted Characteristics - Environmental47
Table 1-15: Typical Characteristics - Signal Acquisition System51
Table 1-16: Typical Characteristics - Triggering System55
Table 2-1: Power-Cord Conductor Identification61
Table 2-2: Power Cord Identification61
Table 2-3: Effects of Corrupted Data63
Figure 2-1: Map of Display Functions67
Figure 4-1: Map of Display Functions84
Figure 4-2: Verifying Adjustments and Signal-Path Compensation87
Figure 4-3: Universal Test Hookup for Functional Tests - TDS 600B Shown89
Table 4-1: Test Equipment97
Table 4-2: DC Offset Accuracy (Zero Setting)109
Figure 4-4: Measurement of DC Offset Accuracy at Zero Setting110
Figure 4-5: Initial Test Hookup111
Table 4-3: DC Voltage Measurement Accuracy112
Figure 4-6: Measurement of DC Accuracy at Maximum Offset and Position113
Figure 4-7: Initial Test Hookup115
Figure 4-8: Optional Initial Test Hookup115
Table 4-4: Analog Bandwidth116
Figure 4-9: Measurement of Analog Bandwidth118
Figure 4-10: Initial Test Hookup120
Figure 4-11: Measurement of Channel Delay - TDS 684B Shown122
Table 4-5: Delay between Channels Worksheet123
Figure 4-12: Initial Test Hookup124
Figure 4-13: Measurement of Accuracy - Long-Term and Delay Time126
Figure 4-14: Initial Test Hookup127
Triggering128
Figure 4-15: Measurement of Time Accuracy for Pulse and Glitch129
Figure 4-16: Initial Test Hookup130
Figure 4-17: Measurement of Trigger-Level Accuracy132
Figure 4-18: Initial Test Hookup135
Figure 4-19: Measurement of Trigger Sensitivity - 50 Mhz Results136
Figure 4-20: Initial Test Hookup139
Figure 4-21: Measurement of Main Trigger out Limits141
Figure 4-22: Initial Test Hookup143
Figure 4-23: Measurement of Probe Compensator Frequency145
Figure 4-24: Subsequent Test Hookup146
Figure 4-25: Measurement of Probe Compensator Amplitude147
Figure 4-26: Jitter Test Hookup149
Figure 4-27: Jitter Test Displayed Waveform - TDS 684B Shown150
Figure 4-28: Jitter Test When Completed - TDS 684B Shown151
Figure 4-29: Triggered Signal Range Test - 300 MV153
Oscilloscopes160
System172
Table 5-1: Calibration Tests173
Table 5-2: Adjustments Required for Module Replaced174
Table 5-3: Adjustments and Dependencies174
Table 5-4: Test Equipment, Fixtures, and Supplies175
Table 5-5: GPIB Board Configuration177

Tektronix TDS 520B - Page 69

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