Commissioning P54x/EN CM/La4
MiCOM P543, P544, P545 & P546
CM) 10-11
CM
Note: The default settings for the relay’s programmable scheme logic has
the ‘AR Trip Test’ signals mapped to the ‘Trip Input’ signals as shown
in Figure 1 (P543 & P545 software version 54) and Figure 2 (P544 &
P546
software version 55). If the programmable scheme logic has
been changed, it is essential that these signals retain this mapping for
the ‘Test Auto-reclose’ facility to work.
Trip Inputs A
DDB #530
AR Trip Test A
DDB #577
AR Trip Test B
DDB #578
Trip Inputs B
DDB #531
AR Trip Test C
DDB #579
Trip Inputs C
DDB #532
AR Trip Test
DDB #576
Trip Inputs 3Ph
DDB #529
P4350ENa
Figure 1 Auto-reclose default PSL mapping – P543 & P545 software versions
44 and 54
Figure 2 Auto-reclose default PSL mapping – P544 & P546 software versions
45 and 55
2.11 Static test mode
Mode
rn dynamic secondary injection test sets are able to accurately mimic real power
system faults. The test sets mimic an instantaneous fault “shot”, with the real rate of rise of
current, and any decaying DC exponential component, according to the point on (voltage)
wave of fault inception. Injections for all three phases provide a six signal set of analog
inputs: Va, Vb, Vc, Ia, Ib, Ic. Such injection test sets can be used with the P54x, with no
special testing limitations.
Conversely, older test sets may not properly simulate:
A healthy prefault voltage memory
A real fault shot (instead a gradually varying current or voltage may be used)
The rate of rise of current and DC components
A six signal set of analog inputs (instead, these may offer for example: Va, Vb, Ia, Ib
only, to test for an A-B injection)
Such injection sets may be referred to as “Static” simulators.
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