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Brand | GE |
---|---|
Model | Phasor XS |
Category | Measuring Instruments |
Language | English |
Details the primary functions of the instrument's keypad buttons for basic control.
Explains the power key, test key, and rotary knob operations for advanced control.
Guide to selecting modes, and setting language, units, date, and time for system operation.
Covers adjusting display brightness, color palette, and background for optimal viewing.
Instructions for entering probe and wedge identification and velocity data for accurate scanning.
Details the configuration of wedge offset, angle, front, and origin for precise measurements.
Parameters required for defining linear and sector scan types for specific inspections.
Configuration of pulser, receiver, and gate parameters for optimal signal acquisition.
Selecting scan views, adjusting leg count, and display delay for data analysis.
Setting and defining measurement parameters for detailed analysis of scan results.
How measurements are taken from the front wedge with zero offset for calibration.
Explains how positive or negative origin offset affects measurement accuracy.
Using cursors and origin lines within the freeze menu for evaluating frozen images.
Options for MEAS, RESULTS, OFFLN DB, and FILENAME within the freeze menu.
Process for creating, naming, and saving data sets to memory or SD card.
Procedures for recalling, deleting, and editing existing data sets.
Settings for including headers, memos, parameters, and images in generated reports.
Steps for naming and saving reports to SD cards, including auto-store functionality.