Gossen MetraWatt SECUTEST ST BASE - Connecting the Device under Test; List of Possible DUT Connections Depending on Measurement Type

38 Gossen Metrawatt GmbH
13 Connecting the Device Under Test
Note
Always connect the DUT in accordance with the sche-
matic diagrams included in the online help function (see
section 7.4 “Help Functions (HELP key)”).
Connection of the DUT to the test instrument depends on:
• The type of DUT:
For direct connection to the test socket (TS)
For DUTs with single-phase connection
and extension cords via the EL1 adapter
(in which case the EL1 is connected to probe sockets P1)
For permanent connection (to the mains)
by contacting the housing with the probe
(for the measurement of protective conductor resistance or
with the direct measuring method for the touch current
measurement)
Measurement of protective conductor current with a current clamp
(only possible with feature I01)
For connection via adapter
– With single-phase extension cords via the EL1 adapter
(in which case the EL1 is connected to probe sockets P1)
– With single and 3-phase extension cords
via the VL2E adapter
to the test socket
– With devices with 5-pole, 16 A CEE plug
via the AT16-DI differential current adapter to the test socket
– With devices with 5-pole, 32 A CEE plug
via the AT32-DI differential current adapter to the test socket
• DUT protection class (PC I, PC II or PC III) or any combinations
of protection classes
Note
The DUT must be switched on for all tests. Switches,
relays, temperature regulators etc. must all be taken into
consideration.
As a default setting, the program sequence assumes that the plug
from the DUT has been connected to the test socket.
13.1 List of Possible DUT Connections
Depending on Measurement Type
Meas. Type Suitable for DUT Connection via
RPE
PE(TS) - P1 passive Test socket, EL1 test socket, VL2E, AT3-IIIE, AT3-IIS, AT3-
IIS32, AT16DI/AT32DI
PE(TS) - P1 active Test socket (for PRCDs)
PE(mains) - P1 Permanent connection
PE(mains) - P1 clamp Permanent connection
P1 - P2 Permanent connection
RINS
LN(TS) - PE(TS) Test socket, EL1, VL2E, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/
AT32DI, CEE adapter
LN(TS) - P1 Test socket, VL2E, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/AT32DI
P1 - P2 No connection (PC3)
PE(mains) - P1 Permanent connection
PE(TS) - P1 Test socket
LN(TS) - P1//PE(TS) Test socket, VL2E, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/AT32DI
IPE
Direct Test socket, AT16DI/AT32DI (direct or diff.)
Differential Test socket
Alternative Test socket, VL2E, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/AT32DI
AT3 adapter AT3-IIIE, AT3-IIS, AT3-IIS32
Clamp Permanent connection
IT
Direct Test socket, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/AT32DI
Differential Test socket
Alternative (P1) Test socket, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/AT32DI, VL2E
Permanent connection Permanent connection
Alternative (P1–P2) No connection (PC3)
IE
Direct Test socket, AT16DI/AT32DI (only diff. is sensible)
Differential Test socket
Alternative Test socket, AT16DI/AT32DI
AT3 adapter AT3-IIIE, AT3-IIS, AT3-IIS32
Clamp Permanent connection
IA
Direct (P1) Test socket
Alternative (P1) Test socket
Perm. conn. (P1) Permanent connection
IP
Direct (P1) Test socket
Perm. conn. (P1) Permanent connection
U probe
PE - P1 Permanent connection
PE - P1 (with mains) Test socket
U meas.
V - COM Permanent connection
V - COM (with mains) Test socket
tPRCD
Mains to test socket Test socket
P
Function test Test socket, AT3-IIIE, AT3-IIS, AT3-IIS32, AT16DI/AT32DI, CEE
adapter
EL1
EL1 adapter EL1 and test socket
EL1 adapter
(continuity only)
EL1 and test socket
AT3-IIIE adapter AT3-IIIE
VL2E adapter VL2E
Temperature
V-COM PT100(0) Permanent connection
Current (via clamp)
V-COM Permanent connection
V-COM (with mains) Test socket
PRCD time to trip
— Test socket