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Hitachi HTS541616J9SA00 - Page 145

Hitachi HTS541616J9SA00
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Travelstar 5K160 (SATA) Hard Disk Drive Specification
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Figure 92 Error data structure
State field contains a value indicating the device state when command was issued to the device.
Value State
x0h
Unknown
x1h
Sleep
x2h
Standby
x3h
Active/Idle
x4h
S.M.A.R.T. Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Note: The value of x is vendor specific.
14.40.6 Self-test log data structure
The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields
shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering.
Description Bytes Offset
Data structure revision 2 00h
Self-test number 1 n*18h+02h
Self-test execution status 1 n*18h+03h
Life time power on hours 2 n*18h+04h
Self-test failure check point 1 n*18h+06h
LBA of first failure 4 n*18h+07h
Vendor specific 15 n*18h+0Bh
...
Vendor specific 2 1FAh
Self-test log pointer 1 1FCh
Reserved 2 1FDh
Data structure checksum 1 1FFh
512
Note: n is 0 through 20
Figure 93 Self-test log data structure
The data structure contains the descriptor of Self-test that the device has performed. Each
descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21
descriptors.
After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new
descriptor.
Self-test log pointer points the most recent descriptor. When there is no descriptor the value
is 0. When there is descriptor(s) the value is 1 through 21.
14.40.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log
allows the host to select the parameters for the self-test and to monitor the progress of the
self-test. The following table defines the contents of the Selective self-test log which is
512 bytes long. All multi-byte fields shown in these data structures follow the specifications
for byte ordering.
Description Bytes Offset Read/Write
Data structure revision 2 00h R/W
Starting LBA for test span 1 8 02h R/W
Ending LBA for test span 1 8 0Ah R/W

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