HP 8753D Option 011

Affected
Measurements
Low
reection device
measurements
are most
aected b
y directivit
y errors.
Figure
EDFEDR
here.
Figure
11-2.
Typical
EDF/EDR
without
and
with
Cables
Source
Match
(ESF
and
ESR)
Description
Source
matc
h
is
a
measure
of
test
p
ort
connector
matc
h,
as
w
ell
as
the
matc
hb
et
w
een
all
comp
onents
from the
source
to
the
test
p
ort.
These
are
the
forw
ard
and
rev
erse
uncorrected
source matc
h terms
of
the
driv
en
p
ort.
Significant
System
Components
load calibration
kit
device
op
en
calibration
kit device
short
calibration
kit
device
bridge
test
p
ort
connectors
bias tees
step atten
uator
transfer switc
h
test
port cables
Affected Measurements
Reection and transmission measurements of highly reective devices are most aected by
source match errors.
11-8 Error Terms DRAFT
3/21/106 15:14
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