FAULT LOCATING TESTS (Cont)
2. Segment Scopex
Test number
is
shown
as
follows:
IA
B 32E
First digit
is
segment number in hex. Last digits are test numbers within the segment
in hex. Zeroes are
not
printed between the segment and test numbers.
G/F,G/FI
Shown adjacent
to
those points appearing in a sensitive
path
for the first time in
any test.
Ttese
points should be scoped first, after it has been determined
that
the
output
point
(first line
of
test)
is
incorrect.
NOTE:
If
there are four or less
G/F,
G/Fl
points (including cards listed at the
end
of
the test), replace the specified cards one at a time and rerun the entire test for each card.
If
the failure
is
not
cleared
or
there arc more than four
GjF,
GjFI points, use scope
to
isolate the failure.
Column heading-"V"
A two-character field defining the timing relationship and voltage level that should
be
observed
if
the point
is
not
failing.
Voltage level:
1=+
level
O=~
level
A or
* = During
or
After
B = During
C = Before
or
During
D = Before
Timing Relationship:
~~
A or * (Trigger
Output)
I--'c"-o:.:r----'~=--'(Latch
Output)
II-D
______
(Latch or Tgr
Output)
*More
than
one card
is
involved in the feedback
loop
of
a tgr.
If
this
is
a failing point, refer
lu
ALD's
to
determine
all
of
the cards
to
be
changed.
t-..
More than
one
(;
d
is
involvE',;
loop
of
3laT~l:.
1f
this
is
()
f:llii!lg
point,
refer lo
ALD's
to
determine
a])
of
the cards
to
be
changed.
NOTE: The clock displayed above
is
a normal P2. Triggers
that
are set by a delayed
clock
(stat
tgr's,
SOEM
character recognition tgr's, etc.) will have their timings displaced
to
the right by the
amount
of
the delay. Refer
to
ALD.s
to
verify delayed clocks
if
timings arc displaced.
S/360 MODEL 65
51
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