Description of Self Test Items C-21
Analysis to Test Failure
If the test result is NaN, it indicates the user ends the test in the process.
If the test result is FAIL, it indicates the CPU temperature is too high.
Suggestion to Test Failure
If the CPU temperature is too high, it is recommended to check CPU fan and the thermal adhesive
of COME radiator.
C.1.50 Z1901 MF FPGA and SM ARM Interconnection Test
Top test item
PC Module and MF FPGA Interconnection Test
Test content
Test whether UART communication between MF FPGA and battery management ARM works well.
Send the order through SM serial port drive, and re-read the data via the port.
Analysis to test failure
The drive goes wrong if the test result appears Error.
UART interconnection between MF FPGA and battery management ARM goes wrong if the test
fails.
Suggestion to failure test
Restart the device to perform the self test if the test result appears Error. It is necessary to recover
the device if Error re-appears.
It is recommended to replace the battery management board if the test result is FAIL.
C.1.51 Z1902 Battery I2C Interconnection Test
Top test item
MF FPGA and SM ARM Interconnection Test