Mirion Technologies MBD-2 - Page 24

MBD-2 Operating Manual 24
15-00167, Rev 1
8
Detector Element has
Overflown
Problem: The device has reported that one of more detector
elements has exceeded maximum dose.
Resolution: Requires a reset of the device. Remove device
from service.
9
Recombination has
Occurred
Problem: Recombination has occurred in an ionization chamber
element a gamma flash or neutron burst event.,
Resolution: Requires a reset of the device. Remove device
from service.
A
DA Element has been
Disabled
Problem: Device restarts from reset after a battery change.
Resolution: If internal data memory is found to be corrupt,
device will perform a self-hard reset to clean memory with clean
data from flash memory. If error message occurs under normal
use (no high dose or neutron exposure), remove device from
service.
B Display access failed
Problem: A The device has reported an error when attempting a
display update
Resolution: If display indicates corrupt or erratic segments,
physical damage has occurred to the LCD. If there is no visual
damage to the LCD, a possible corruption to the histogram data
exists.
If the problem is repeated without visual LCD damage, remove
from service.
C
DAC value is out of
bounds
Problem: the RAM memory has been corrupted
Resolution:
D
Device temperature is
too low
Problem: The device temperature is below the factory-set low
limit of -10C. The read-out process is halted until the temperature
increases
Resolution: Move the device to a warmer environment and
stabilize. The Lo-T message disappears.
E
Device temperature is
too high
Problem: The device temperature is above the factory-set high
limit of C. The read-out process is halted until the temperature
decreases.
Resolution: Move the device to a cooler environment and
stabilize. The Hi-T message disappears.
F
NFC chip is not
responding
Problem: The NFC chip is not responding due to an electronics
failure.
Resolution: Read-out is not possible. Remove device from
service.