Nikon Eclipse Ci-E User Manual

1
Chap. 1-1
Microscopy Procedures
1
Microscopy Procedures
Bright-field Microscopy
1
Bright-field Microscopy
1.1
System Configuration and Controls
This section explains an example system configuration and the controls required for bright-field microscopy using the
ECLIPSE Ci-E.
Names of components are denoted in the following manner: [Eyepiece].
CLAMP
TORQUE
0.1
0.3
0.4
0.5
0.2
0.9
0.8
DSC
MODEL ECLIPSE Ci-E
USB REMOTE FOOT SWITCH
NIKON CORPORATION
TOKYO, JAPAN
100–240V~
1.0A
50/60Hz
MADE IN CHINA
This device complies with Part 15 of the FCC
Rules. Operation is subject to the following two
conditions:
(1) this device may not cause harmful interference,
and (2) this device must accept any interference
received, including interference that may cause
undesired operation.
This Class A digital apparatus complies with
Canadian ICES-003.
Cet appareil numérique de la classe A est
confirme à la norme NMB-003 du Canada.
930001
4N75
INSPECTION
EQUIPMENT
70
60
50
40
30
20
10
0
90
80
X knob
Condenser focus knob
Y knob
Grip
Coarse focus torque
adjustment knob
AC inle
t
Input voltage
label
[Eyepiece]
[Objective]
[Stage]
[Condenser]
[Tube]
[Nosepiece]
[Main body]
Diopter adjustment ring
Condenser centering screw
Optical path
switching lever
A
perture
diaphragm lever
Power switch
Coarse focus knob
Fine focus knob
Capture button
Moving claw of the
s
p
ecimen holde
r
Nosepiece forward
rotation button
Condenser focus knob
Field diaphragm dial
Coarse focus clamp ring
Coarse focus knob
Fine focus knob
DSC connecto
r
Swing-out condenser connecto
r
Nosepiece reverse
rotation button
Lamphouse
FOOT SWITCH
connecto
r
REMOTE
connecto
r
USB connecto
r
Nosepiece reverse rotation button
Nosepiece forward rotation button
RQ
UE
P
O
WER
Dia-illumination
brightness control knob
Dia-illumination LED
ON/OFF switch

Nikon Eclipse Ci-E Specifications

General

Brand	Nikon
Model	Eclipse Ci-E
Category	Microscope
Language	English