6 – PC SOFTWARE
MODEL 5000 SERIES MANUAL Version 1.23 6-7
Sends a previously saved STI Lot Summary file (“.SUM”) to WordPad . The file can
be reviewed, edited and printed.
6.3.1.7.5 Print Columnar File
Prompts the user if this is to be a new STI Columnar file and, if yes, select the
desired STI data file to use to create the columnar file.
The selected STI columnar file (“.COL”) is then printed.
NOTE: STI columnar files can be created, along with the other STI data files using
the Create STI Translated Files menu selection.
6.3.1.7.6 Wafer Mapping Option
The Wafer Mapping Option requires STI 5000 Series Tester firmware with the Wafer
Mapping Option Enabled. In addition, the prober being used must provide Wafer row
and column information for each die. This row and column data along with the Bin
and Sort results is encoded in the datalog data file.
Creating a wafer map requires, first, generating the datalog data file (with the
required encoded mapping information). This is accomplished by selecting the
“Runtime->Tester Controls” menu selection, and then clicking the “Wafer Map”
button. The “Wafer Map” button should display “Wafer Map Off” before and then
“Wafer Map On” afterwards. The datalog method can be just “Go/Nogo” if the map
will be based upon Bin or Sort results or full datalog data if the map is to based upon
a specific test parameter.
Note: The “Create Wafer Map” button is enabled once a valid data file has been
selected. However, until the remaining configuration information is selected, the
created map would not be very meaningful.
Once the encoded datalog file has been generated, the map can be created. Select
the “Runtime->Data Utilities->Wafer Map” menu selection. The screen shown in
Figure 6-1 will be displayed.
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