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General| Model | 2450 |
|---|---|
| Type | SourceMeter |
| Category | Laboratory Equipment |
| Maximum Output Power | 20 W |
| Maximum Power | 20 W |
| Display | 5-inch capacitive touchscreen |
| Interface | USB, Ethernet, GPIB |
| Current Source Range | 10 nA to 1 A |
| DC Current Source Range | 10 nA to 1 A |
| DC Current Source Accuracy | 0.03% of setting |
| DC Current Measurement Range | 10 nA to 1 A |
| Power Range | Up to 20 W |
| Resolution | 6.5 digits |
| Connectivity | USB, Ethernet, GPIB |
| Supported Applications | I-V characterization, semiconductor testing, component testing |
| Voltage Measurement Resolution | 100 nV |
| Measurement Resolution | 6.5 digits |
Identifies the instrument model and product name.
Defines responsibilities for instrument use, maintenance, and operation.
Critical warnings about electrical shock hazards, voltage levels, and safe connection practices.
Ensuring safe operation via proper power cord connection, grounding, and cable inspection.
Guidelines on proper instrument usage, limitations, and component replacement for safety.
Explanation of warning and caution symbols used on instruments and in documentation.
Procedures for safe maintenance, component replacement, and cleaning of instruments.
Introduction to the 2450 SourceMeter® Instrument and its features.
Overview of the manual's content, structure, and how to use it for applications.
Information on purchasing additional warranty coverage for products.
How to contact Keithley Instruments for support and inquiries.
List of available documentation for the 2450, including guides and manuals.
Description of how the manual is organized into different sections.
Overview of application examples provided in the manual for the 2450 instrument.
Instructions for powering the 2450 instrument on/off and connecting the power cord.
Overview of the 2450's front panel controls, display, and interface elements.
Detailed descriptions of front panel buttons, indicators, and interface components.
How to interact with the touchscreen, navigate menus, and use swipe screens.
Explanation of scroll bars and how to use interactive swipe screens on the touchscreen.
Description of the options available in the swipe screen heading bar.
Details on the SOURCE and SETTINGS swipe screens for instrument configuration.
Overview of STATISTICS, USER, and GRAPH swipe screens for data display.
Navigating the main menu and saving measurement data to a USB flash drive.
Procedure for saving screen captures of the front panel display to a USB drive.
Overview of available communication interfaces for remote control of the 2450.
Details on the supported remote interfaces: GPIB, Ethernet, USB, and TSP-Link.
Information on setting up and using the GPIB interface for instrument communication.
Instructions for setting the GPIB address for instrument identification and communication.
Details on establishing and using LAN connections for instrument communication.
Steps to configure automatic IP address selection for LAN communication.
Instructions for manually setting IP address, gateway, and subnet mask for LAN.
Procedure to verify that the 2450 instrument is connected to the network via LAN.
How to use the LXI Discovery Tool to find the instrument's IP address.
Information on setting up and using USB connections for instrument communication.
Steps to connect a computer to the 2450 instrument using a USB cable.
Using NI-VISA and resource strings for USB communication with the instrument.
Procedure to verify instrument communication using the Keithley Communicator tool.
How to access and use the instrument's web interface for settings and control.
Tips for troubleshooting connectivity issues with the LAN interface.
Description of the information and features available on the instrument's web home page.
How to use the ID button to identify a specific instrument in a system.
How to access and review the instrument's event log for LXI events.
Guide to determining and changing the instrument's command set (SCPI, TSP).
Overview of front-panel measurements and required equipment.
How to connect the instrument and the device under test (DUT) for measurements.
Step-by-step guide to taking measurements using the front panel interface.
Overview of low-resistance measurement and required equipment.
How to set up remote communication for running the low-resistance measurement application.
Connecting the DUT for low-resistance measurements using 4-wire (Kelvin) method.
Steps to perform low-resistance measurements from the front panel.
How to view resistance measurements graphically on the front panel.
Accessing measurement statistics on the STATISTICS swipe screen.
Using SCPI commands to perform 100 low-resistance measurements.
Using TSP commands to perform low-resistance measurements with the 2450.
Overview of leakage/insulation tests and required equipment.
Setting up remote communications and connecting DUTs for leakage/insulation tests.
Procedure for measuring capacitor leakage current using the 2450 front panel.
Detailed steps for setting up and performing leakage current measurements.
Viewing leakage current measurements graphically on the front panel.
Using SCPI commands for capacitor leakage current measurement.
Using TSP commands for capacitor leakage current measurement.
Steps to measure insulation resistance using the 2450 front panel.
Detailed steps for setting up insulation resistance measurements.
Viewing insulation resistance measurements graphically on the front panel.
Using SCPI commands for insulation resistance measurements.
Using TSP commands for insulation resistance measurements.
Overview of FET I-V testing and required equipment.
Setting up remote communications and external triggers for FET testing.
Examples of cabling and connections for SCPI and TSP command sets.
Connecting two 2450s to a MOSFET for drain family of curves measurement.
Using SCPI commands and trigger model for FET drain family of curves.
Using SCPI commands for FET I-V characterization with a linear sweep.
Overview of controlling FET testing remotely using TSP commands.
Using TSP commands and trigger model for FET drain family of curves.
Using TSP commands for FET I-V characterization with a linear sweep.
Overview of battery testing and required equipment.
Connecting the 2450 to a battery for charge/discharge testing.
Automating battery charge and discharge cycles using SCPI and TSP commands.
Using SCPI commands for automated battery charge/discharge testing.
Using TSP commands for automated battery charge/discharge testing.
Overview of solar cell I-V testing and required equipment.
Setting up remote communications and connecting solar cells for I-V measurements.
Steps to characterize a solar cell's I-V behavior using front panel, SCPI, and TSP.
Performing a solar cell I-V sweep using the front panel interface.
Using SCPI commands to perform a solar cell I-V sweep.
Using TSP commands to perform a solar cell I-V sweep.
Guidance on obtaining the latest instrument drivers from the support website.
Procedure for upgrading or downgrading the instrument's firmware using a USB drive.
Troubleshooting USB flash drive compatibility issues with the 2450.
Instructions for changing the instrument's command set (SCPI, TSP).
Explanation of event code 5074 related to the interlock circuit and high voltage.
Methods for saving instrument settings as a script using front panel or commands.
Understanding settings changes and using Quick Setup options.
Information on additional resources, handbooks, and support channels for the 2450.
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