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Tektronix TDS5104B

Tektronix TDS5104B
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Table of Contents
ii
TDS5000B Series Specifications and Performance Verification
List of Figures
Figure 2--1: Toolbar and menu bar 2--3...........................
Figure 2--2: Universal test hookup for functional tests -- CH 1 shown 2--7
Figure 2--3: Channel button location 2--8..........................
Figure2--4:Setupfortimebasetest 2--9...........................
Figure 2--5: Setup for trigger test 2--11.............................
Figure 2--6: Setup for the file system test 2--13.......................
Figure 2--7: Example test page from the internal printer 2--15.........
Figure 2--8: Initial test hookup 2--25...............................
Figure 2--9: Measurement of DC accuracy at maximum offset
and position 2--27...........................................
Figure 2--10: Initial test hookup 2--29..............................
Figure 2--11: Optional initial test hookup 2--29......................
Figure 2--12: Measurement of analog bandwidth 2--32................
Figure 2--13: Initial test hookup 2--34..............................
Figure 2--14: Measurement of channel delay 2--36...................
Figure 2--15: Initial test hookup 2--37..............................
Figure 2--16: Initial test hookup 2--39..............................
Figure 2--17: Measurement of accuracy -- long-term and delay time 2--41
Figure 2--18: Delta time accuracy test hookup 2--42..................
Figure 2--18: Initial test hookup 2--45..............................
Figure 2--19: Measurement of time accuracy for pulse and
glitch triggering 2--47........................................
Figure 2--20: Initial test hookup 2--49..............................
Figure 2--21: Measurement of trigger sensitivity showing 50 MHz results . .
2-- 50
Figure 2--22: Initial test hookup 2--54..............................
Figure 2--23: Measurement of main trigger out limits 2--56............
Figure 2--24: Initial test hookup 2--57..............................
Figure 2--25: Measurement of probe compensator frequency 2--58......
Figure 2--26: Subsequent test hookup 2--59.........................
Figure 2--27: Measurement of probe compensator amplitude 2--60......
Figure 2--28: Sine wave generator leveling equipment setup
(Method A) 2--61...........................................
Figure 2--29: Sine wave generator leveling equipment setup
(Method B) 2--63............................................

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