Testboy TV 455 - C Appendix F - Country Notes; List of Country Modifications; Modification Issues; AT Modification - G Type RCD

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TV 450/455 Appendix C
77
C Appendix F – Country notes
This appendix F contains collection of minor modifications related to particular country
requirements. Some of the modifications mean modified listed function characteristics
related to main chapters and others are additional functions. Some minor modifications
are related also to different requirements of the same market that are covered by
various suppliers.
C.1 List of country modifications
The following table contains current list of applied modifications.
Country Related chapters Modification type Note
AT 5.4, 9.3, C.2.1 Appended Special G type RCD
C.2 Modification issues
C.2.1 AT modification - G type RCD
Modified is the following related to the mentioned in the chapter 5.4:
- G type mentioned in the chapter is converted to unmarked type
,
- Added G type RCD,
- Time limits are the same as for general type RCD,
- Contact voltage is calculated the same as for general type RCD.
Modifications of the chapter 5.4
Test parameters for RCD test and measurement
TEST RCD sub-function test [RCDt, RCD I, AUTO, Uc].
Iδn Rated RCD residual current sensitivity I
ΔN
[10 mA, 30 mA, 100 mA, 300
mA, 500 mA, 1000 mA].
type
RCD type [
, , ], test current waveform plus starting polarity [ , ,
,
, *, *
].
MUL
Multiplication factor for test current [½, 1, 2, 5 Iδn].
Ulim Conventional touch voltage limit [25 V, 50 V].
Note:
 Ulim can be selected in the Uc sub-function only.
The instrument is intended for testing of general
,
G
(non-delayed) and selective
S
(time-delayed) RCDs, which are suited for:
 Alternating residual current (AC type, marked with
symbol),
 Pulsating residual current (A type, marked with
symbol).
 DC residual current (B type, marked with
symbol).
Time delayed RCDs demonstrate delayed response characteristics. They contain
residual current integrating mechanism for generation of delayed trip out. However,