Rockwell Automation Publication 1791ES-UM001G-EN-P - November 2016 157
Safety Data Appendix B
1732ES-IB8XOB8 
Single Channel Inputs
1 8760 2.32E-06 5.38E-10 6.813E-06 16.75
2 17520 4.63E-06
5 43800 1.16E-05
10 87600 2.33E-05
20 175200 4.69E-05
1732ES-IB8XOB8 Dual 
Channel Inputs
1 8760 5.51E-07 1.35E-10
2 17520 1.11E-06
5 43800 2.78E-06
10 87600 5.64E-06
20 175200 1.16E-05
1732ES-IB8XOB8
(1)
 
Single Channel 
Outputs
1 8760 2.95E-05 6.75E-09
2 17520 5.91E-05
5 43800 1.48E-04
10 87600 2.95E-04
20 175200 5.91E-04
1732ES-IB8XOB8 
Dual Channel Outputs
1 8760 5.62E-07 1.38E-10
2 17520 1.13E-06
5 43800 2.84E-06
10 87600 5.75E-06
20 175200 1.18E-05
1732ES-IB16 
Single Channel Inputs
1 8760 2.32E-06 5.38E-10 6.526E-06 17.49
2 17520 4.63E-06
5 43800 1.16E-05
10 87600 2.33E-05
20 175200 4.69E-05
1732ES-IB16 
Dual Channel Inputs
1 8760 5.51E-07 1.35E-10
2 17520 1.11E-06
5 43800 2.78E-06
10 87600 5.64E-06
20 175200 1.16E-05
(1) Single channel output mode is only valid for applications with Process Safety Times ≥ 600msec  OR  with Demand Rates ≤ 1 
Demand per Minute.
(2) Mission time for all modules is 20 years.
(3) Calculated based on ISA TR-84 method.
(4) Mean Time to Failure (Spurious).
Table 66 - Failure Rate Data (failures per hour)
(1)
Cat. No. I/O Configuration λ
S
λ
DD
λ
DU
1791ES-OB8XOBV4 Single Channel Inputs 7.8343E-07 7.5766E-07 5.5089E-09
Dual Channel Inputs 1.1786E-06 1.1552E-06 2.6384E-10
Dual Channel Outputs 1.7205E-06 1.7009E-06 3.0765E-10
1791ES-IB16 Single Channel Inputs 7.8024E-07 7.5356E-07 5.5087E-09
Dual Channel Inputs 1.1760E-06 1.1519E-06 2.5974E-10
Cat. No. Proof Test Interval 
(Mission Time
(2)
)
PFD PFH
(1/hour)
Spurious 
Trip Rate 
(STR)
(3)
MTTF
Spurious
(4)
 
(years)
Year Hour