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TGH1266E - 05/04
Practical Use
EDS3065 in diode
decoupled systems
How to find insulation faults:
• The central insulation monitoring device (IMD) has indicated an insulation fault which
is detectable by the EDS3065. Please refer to chapter „Points to be considered before
use“ in the EDS3065 manual TGH1266E.
• Read the current insulation resistance from the insulation monitors indication, e.g. the
LC display when the IRDH265/365 is used. If the indicated value of the insulation
resistance is lower than the max. detectable insulation fault of the EDS3065, then
switch with S1 from the insulation monitor th the EDS 3065.
• Connect the test device PGH185 according to the drawing on previous page to the
electrical system. It is important to use the recommended connecting points for the
EDS185.
• Now prepare the evaluating device EDS165:
- connect the two identical clamp-on probes (PSA3052 or PSA3020)
with the coaxial cables and the T-adaptor.
- set the operating mode selector switch to position I∆n
- set following parameters:
menu 2: memory off
menu 3: buzzer on
menu 4: set sensor to the used clamp-on probe
menu 5: frequency 50 Hz
• Start of the EDS3065:
embrace the PE conductor of the PGH185 with one of the connected clamp-on probes.
If the test current I∆n indicated on the LC display of the EDS165 is higher than
10 mA, a successful insulation fault location is possible. Remove the clamp-on probe
from the PE conductor.
Now embrace the L+ and L- conductors with the clamp-on probe but not the PE
conductor.
• Fault location in the system:
Embrace the conductors (not the PE) of the redundant lines to the consumers with a
clamp-on probe each. Consider to embrace the correct corresponding redundant lines.
Consider the energy flow direction (P1 => P2) of the clamp-on probes.
Embrace systematically and one after the other all parallel lines to the consumers with
the clamp-on probes. Insulation faults behind a clamp-on probe will be indicated on the
EDS165 display.
Caution: an alarm will be indicated about 30 seconds after embracing the conductors
with the clamp-on probe.
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