Extech Electronics 7611 - Chapter 7: Test Parameter Setup Procedures

TEST PARAMETER SETUP PROCEDURES
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CHAPTER 7 : Test Parameter Setup Procedures
Before going to setup the Test Parameters, make sure that the key lock function is set to
Unlock mode, then follow this procedures to setup the Test Parameters.
7.1 High Trip
The High current trip limit is used to program the maximum allowable leakage
current limit for each configuration that has been selected for each step.
Press the TRIP key, the display will show:
HI-Trip: 1000
µ
A
Range: 0, 1 - 6000
Use the Numeric Keys to enter the trip current value, and then press the ENTER
key. The program will store this value and advance to the LO-Trip parameter
automatically. When the trip current is set to 0
µ
A the High current trip limit will
be disabled.
7.2
Low Trip
The Low current trip limit is used to program the minimum allowable leakage
current limit for each configuration that has been selected for each step.
Press the TRIP key twice, the display will show:
LO-Trip: 1000
µ
A
Range: 0, 1 - 6000
Use the Numeric Keys to enter the trip current value, and then press the ENTER
key. The program will store this value and advance to the HI-Trip parameter
automatically. When the trip current is set to 0
µ
A the Low current trip limit will
be disabled. Press the EXIT key to return to the operational mode.
7.3 Delay Time
The Delay Time setting is used to program the amount of time that may be needed
to delay the trip current detectors until the DUT has reach proper operating
conditions. The trip current judgment is activated at the end of the Delay Time.
The instrument will not indicate that the Trip Current limit has been exceeded until
the Delay Time period has expired. Press the DELAY key, the display will show:
Delay 2.5 s
Range 0, 1-999.9
Use the Numeric Keys to enter the Delay Time value, and then press the ENTER
key. The program will store this value and return to the operation mode
automatically.